환원분위기 열처리가 (Bi,Sb)2Te3 증착박막의 열전특성에 미치는 영향
Effects of Annealing in a Reduction Ambient on Thermoelectric Properties of the (Bi,Sb)2Te3 Thin Films Processed by Vacuum Evaporation
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환원분위기 열처리가 진공증착법으로 형성한 (Bi,Sb)2Te3 박막의 열전특성에 미치는 영향을 연구하였다. 환원분위기(50% H2 + 50% Ar)에서 300oC의 온도로 2시간 유지하여 열처리함으로써 (Bi,Sb)2Te3 박막의 결정성이 크게 향상되었으며 결정립 크기가 크게 증가하였다. 환원분위기 열처리에 의한 정공농도의 감소에 기인하여 (Bi,Sb)2Te3 박막의 Seebeck 계수가 열처리 전의 ~90 μV/K로부터 ~180 μV/K 으로 증가하였다. 환원분위기 열처리에 의해 (Bi,Sb)2Te3 박막의 출력인자(power factor)가 5배에서 16배 정도 향상되었으며, 환원분위기 열처리 후 (Bi,Sb)2Te3 박막은 18.6×10-4 W/K2-m의 최대 출력인자를 나타내었다.
Abstract
Effects of annealing process in a reduction ambient on thermoelectric properties of the (Bi,Sb)2Te3 thin films prepared by thermal evaporation have been investigated. With annealing at 300oC for 2 hrs in a reduction ambient(50% H2 + 50% Ar), the crystallinity of the (Bi,Sb)2Te3 thin films were substantially improved with remarkable increase in the grain size. Seebeck coefficients of the (Bi,Sb)2Te3 thin films increased from ~90 μV/K to ~180 μV/K with annealing in the reduction ambient due to decrease in the hole concentration. Power factors of the (Bi,Sb)2Te3 thin films were remarkably improved for 5~16 times with annealing in the reduction atmosphere. After annealing in the reduction ambient, a (Bi,Sb)2Te3 evaporated film exhibited a maximum power factor of 18.6×10-4 W/K2-m.
참고문헌 (17)
- S. Herwarden, "Sensor applications of thermoelectric thin films", 16th Int. Conf. on Thermoelectrics, pp.47~ (1997)
- M. Muller, "A thermoelectric infrared radiation sensor with monolithically integrated amplifier stage and temperature sensor", Sensors and Actuators, A54, pp.601~ (1996)
- A. Munoz, "PbSe photodetector arrays for IR sensors", Thin Solid Films, 317, pp.425~ (1998)
- A. Mzerd, "Improvement of thermal sensor based on Bi2Te3, Sb2Te3, and Bi0.1Sb1.9Te3", Sensors and Actuators, A46, pp.387~ (1995)
- B. Liautard, "Comparative studies between the growth characteristics of Bi2Te3 thin films deposited on SiO2, Si(100) and Si(111)", J. Crystal Growth, 167, pp.122~ (1996)
- K. Rajasekar, "Thermal sensors based on Sb2Te3 and (Sb2Te3)70(Bi2Te3)30 thin films", Ionics, 14, pp.69~ (2007)
- L. W. da Silva, "Thermoelectric performance of films in the bismuth-tellurium and antimony-tellurium systems", J. Appl. Phys, 97, pp.114903~ (2005)
- V. Damodara Das, "Thickness and temperature dependence of electrical properties of Bi2 (Te0.1Se0.9)3 thin films", J. Appl. Phys, 86, pp.1518~ (1999)
- K. W. Lee, "Thermoelectric properties of p-type (Bi1-xSbx)2Te3 thin films annealed in a hydrogen atmosphere", J. Korean Metals and- Mater. Soc, 40, pp.333~ (2002)
- J. H. Kim, "Structural characteristics of Bi2Te3 and Sb2Te3 films on (001) GaAs substrates grown by MOCVD", 25th Int. Conf. on Thermoelectrics, pp.411~ (2006)
- 이광용, "전기도금 공정으로 제조한 Bi-Te박막의 열전특성 및미세열전소자 형성용 포토레지스트 공정", 마이크전자 및 패키징학회지, 14(2), pp.9~16 (2007), 한국마이크로전자및패키징학회
- Min-Young Kim, "Annealing Behavior of Bi2Te3 Thermoelectric Semiconductor Electrodeposited for Nanowire Applications", Journal of the Korean Physical Society, 50(3), pp.670~676 (2007), 한국물리학회
- W. M. Yim, "Compound tellurides and their alloys for peltier cooling-A review", Solid State Electronics, 15, pp.1121~ (1972)
- J. S. Lee, "Thermoelectric properties of the hot-pressed (Bi0.2Sb0.8)2Te3 alloy with addition of BN and WO3 powders", J. Mater. Sci, 35, pp.881~ (2000)
- M. Ohring, "Materials science of thin films" (1992), Elsevier
- J. Horak, "Energy formation of antisite defects in doped Sb2Te3 and Bi2Te3 crystals", J. Phys. Chem. Solids, 47, pp.805~ (1986)
- K. Uemura, "Thermoelectric Semiconductors and Their Applications", pp.29~ (1988), Nikkan-Kygyo Shinbun Press
