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전기도금법으로 제조한 Ni 박막의 전기비저항 및 솔더 반응성

Electrical Resistivity and Solder-Reaction Characteristics of Ni Films Fabricated by Electroplating

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참고문헌

주제분류재료공학

초록

도금전류밀도에 따른 Ni 박막의 결정립 크기, 전기비저항, 솔더 wetting angle 및 금속간화합물의 성장속도를 분석하였다. 도금전류밀도를 5 mA/cm2에서 40 mA/cm2로 증가시킴에 따라 Ni 박막의 표면 nodule의 크기가 감소하고 결정립이 미세화 되었으며, 전기비저항이 7.37 μΩ-cm에서 9.13 μΩ-cm로 증가하였다. 5 mA/cm2 및 10 mA/cm2에서 도금한 Ni 박막이 40 mA/cm2에서 형성한 Ni 박막에 비해 전기비저항이 낮고 dense 하며 계면 금속간화합물의 성장속도가 느리기 때문에 무연솔더의 UBM 용도로 더 적합할 것이다.

Abstract

: Characteristics of electroplated Ni films such as grain size, resistivity, solder wetting angle, and growth rate of intermetallic compound were evaluated as a function of electroplating current density. With increasing the electroplating current density from 5 mA/cm to 40 mA/cm, the nodule size on the Ni film surface decreased, grain refinement occurred, and resistivity increased from 7.37-cm to 9.13 -cm. Compared with Ni film processed at 40 mA/cm, Ni films electroplated at 5 mA/cm and 10 mA/cm exhibited low resistivity, dense microstructure, and slow growth rate of intermetallic compound. Ni films electroplated at 5 mA/cm and 10 mA/cm are more suitable for Ni UBM application than that fabricated at 40 mA/cm.

참고문헌 (16)

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