원자 현미경용 콜로이드 탐침 수직 스프링 상수 측정
Measurement of Normal Spring Constant of Colloidal Probes for Atomic Force Microscope
0
조회
0
다운로드
0
인용
0
참고문헌
키워드
초록
A modified thermal noise method was proposed to measure the normal spring constants of the colloidal probes for an atomic force microscope. We used commercial tipless cantilevers (length 150, width 30, nominal k 7.4 N/m) and borosilicate spheres with a diameter of 20 to fabricate colloidal probes. The inverse optical lever sensitivity of both the tipless cantilever and colloidal probes were used to measure the normal spring constant of the colloidal probes. We confirmed the accuracy and usefulness of our method by comparing the measurement results with those obtained using the nanoforce calibrator (NFC), which reportedly has an uncertainty of 1.00%. The modified thermal method showed a good agreement (~10% difference) with the NFC, allowing us to conclude that the modified thermal method could be employed for the effective measurement of the normal spring constants of colloidal probes.
Abstract
A modified thermal noise method was proposed to measure the normal spring constants of the colloidal probes for an atomic force microscope. We used commercial tipless cantilevers (length 150, width 30, nominal k 7.4 N/m) and borosilicate spheres with a diameter of 20 to fabricate colloidal probes. The inverse optical lever sensitivity of both the tipless cantilever and colloidal probes were used to measure the normal spring constant of the colloidal probes. We confirmed the accuracy and usefulness of our method by comparing the measurement results with those obtained using the nanoforce calibrator (NFC), which reportedly has an uncertainty of 1.00%. The modified thermal method showed a good agreement (~10% difference) with the NFC, allowing us to conclude that the modified thermal method could be employed for the effective measurement of the normal spring constants of colloidal probes.
참고문헌 (14)
- M. A. Poggi, "Scanning Probe Microscopy", Analytical Chemistry, 76(12), pp.3429~2444 (2004)
- M. Kappl, "The Colloidal Probe Technique and its Application to Adhesion Force Measurements", Particle and Particle Systems Characterization, 19, pp.129~143 (2002)
- H. J. Butt, "Force Measurements with Atomic Force Microscope: Technique, Interpretation and Applications", Surface Science Reports, 59, pp.1~152 (2005)
- 윤의성, "An experimental study on the adhesion at a nano-contact.", Wear, v. 254, pp.974~980.
- J. Lou, "Effects of Interfaces on Nano-friction of Vertically Aligned Multi-walled Carbon Nanotube Arrays", Materials Science and Engineering A, 483-484, pp.664~667 (2008)
- M. A. S. Quintanilla, "Lateral Force Microscopy with Micrometer-sized Particles: Effect of Wear on Adhesion and Friction", Wear, 268, pp.277~286 (2010)
- J. L. Hutter, "Calibration of Atomic-force Microscope Tips", Review of Scientific Instruments, 64(7), pp.1868~1973 (1993)
- J. E. Sader, "Theoretical Analysis of Static Deflection of Plates for Atomic Force Microscope Application", Journal of Applied Physics, 74(1), pp.1~9 (1993)
- J. E. Sader, "Calibration of Rectangular Atomic Force Microscope Cantilevers", Review o f Scientific Instruments, 70(10), pp.3967~3969 (1999)
- M. S. Kim, "SI-traceable Determination of Spring Constants ofVarious Atomic Force Microscope Cantilevers with aSmall Uncertainty of 1%", Measurement Science andTechnology, 18, pp.3351~3358 (2007)
- M. S. Kim, "Accurate Determination of Spring Constant AtomicForce Microscope Cantilever and Comparison withother Methods", Measurement, 43, pp.520~526 (2010)
- L. H. Mak, "Reproducible Attachment of Micrometer Sized Particles to Atomic Force Microscopy Cantilevers", Review of Scientific Instruments, 77, pp.046104~ (2006)
- R. Proksch, "Finite Optical Spot Size and Position Corrections in Thermal Spring Constant Calibration", Nanotechnology, 15, pp.1344~1350 (2004)
- D. A. Walters, "Short Cantilevers for Atomic Force Microscopy", Review of Scientific Instruments, 67(10), pp.3583~3590 (1996)