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Multiple Pivot loading 방법을 이용한 액체 환경에서의 수평방향 힘 교정

Lateral Force Calibration in Liquid Environment using Multiple Pivot Loading

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참고문헌

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초록

Quantifying the nanoscale force between the atomic force microscopy (AFM) probe of a force-sensing cantilever and the sample is one of the challenges faced by AFM researchers. The normal force calibration is straightforward; however, the lateral force is complicated due to the twisting motion of the cantilever. Force measurement in a liquid environment is often needed for biological applications; however, calibrating the force of the AFM probes for those applications is more difficult owing to the limitations of conventional calibration methods. In this work, an accurate nondestructive lateral force calibration method using multiple pivot loading was proposed for liquid environment. The torque sensitivity at the location of the integrated probe was extrapolated based on accurately measured torque sensitivities across the cantilever width along a few cantilever lengths. The uncertainty of the torque sensitivity at the location of the integrated tip was about 13%, which is significantly smaller than those for other calibration methods in a liquid environment.

Abstract

Quantifying the nanoscale force between the atomic force microscopy (AFM) probe of a force-sensing cantilever and the sample is one of the challenges faced by AFM researchers. The normal force calibration is straightforward; however, the lateral force is complicated due to the twisting motion of the cantilever. Force measurement in a liquid environment is often needed for biological applications; however, calibrating the force of the AFM probes for those applications is more difficult owing to the limitations of conventional calibration methods. In this work, an accurate nondestructive lateral force calibration method using multiple pivot loading was proposed for liquid environment. The torque sensitivity at the location of the integrated probe was extrapolated based on accurately measured torque sensitivities across the cantilever width along a few cantilever lengths. The uncertainty of the torque sensitivity at the location of the integrated tip was about 13%, which is significantly smaller than those for other calibration methods in a liquid environment.

참고문헌 (21)

  1. Binnig, G., "Atomic Force Microscope", Phys Rev Lett, 56, pp.930~933 (1986)
  2. Chung, K. H., "Nanomechanical Properties of Thin Films of Type I Collagen Fibrils", Langmuir, 26, pp.3629~3636 (2010)
  3. Mahaffy, R. E., "Scanning Probe-Based Frequency-Dependent Microrheology of Polymer Gels and Biological Cells", Phys Rev Lett, 85, pp.880~883 (2000)
  4. Stan, G., "Ultimate Bending Strength of Si Nanowires", Nano Lett., 12, pp.2599~2604 (2012)
  5. Hutter, J. L., "Calibration of Atomic-Force Microscope Tips", Rev. Sci. Instrum., 64, pp.1868~1873 (1993)
  6. Torii, A., "A Method for Determining the Spring Constant of Cantilevers for Atomic Force Microscopy", Meas Sci Technol, 7, pp.179~184 (1996)
  7. Gates, R. S., "Precise Atomic Force Microscope Cantilever Spring Constant Calibration using a Reference Cantilever Array", Rev. Sci. Instrum., 78, pp.086101~ (2007)
  8. Sader, J. E., "Calibration of Rectangular Atomic Force Microscope Cantilevers", Rev. Sci. Instrum., 70, pp.3967~3969 (1999)
  9. Cain, R. G., "Force Calibration in Lateral Force Microscopy", J. Colloid Interface Sci., 227, pp.55~65 (2000)
  10. Sader, J. E., "In-Plane Deformation of Cantilever Plates with Applications to Lateral Force Microscopy", Rev. Sci. Instrum., 75, pp.878~883 (2004)
  11. Ogletree, D. F., "Calibration of Frictional Forces in Atomic Force Microscopy", Rev. Sci. Instrum., 67, pp.3298~3306 (1996)
  12. Varenberg, M., "An Improved Wedge Calibration Method for Lateral Force in Atomic Force Microscopy", Rev. Sci. Instrum., 74, pp.3362~3367 (2003)
  13. Li, Q., "Lateral Force Calibration of an Atomic Force Microscope with a Diamagnetic Levitation Spring System", Rev. Sci. Instrum., 77, pp.065105~ (2006)
  14. Chung, K. H., "Note: Lateral Force Microscope Calibration using Multiple Location Pivot Loading of Rectangular Cantilevers", Rev. Sci. Instrum., 81, pp.026104~ (2010)
  15. Wang, F., "Effect of Contact Stiffness on Wedge Calibration of Lateral Force in Atomic Force Microscopy", Rev. Sci. Instrum., 78, pp.043701~ (2007)
  16. Wagner, K., "Noncontact Method for Calibration of Lateral Forces in Scanning Force Microscopy", Langmuir, 27, pp.4635~4644 (2011)
  17. Ryu, S., "In Situ Hydrodynamic Lateral Force Calibration of AFM Colloidal Probes", Langmuir, 27, pp.13390~13399 (2011)
  18. Higgins, M. J., "Noninvasive Determination of Optical Lever Sensitivity in Atomic Force Microscopy", Rev. Sci. Instrum., 77, pp.013701~ (2006)
  19. Green, C. P., "Normal and Torsional Spring Constants of Atomic Force Microscope Cantilevers", Rev. Sci. Instrum., 75, pp.1988~1996 (2004)
  20. Chung, K. H., "Accurate Noncontact Calibration of Colloidal Probe Sensitivities in Atomic Force Microscopy", Rev. Sci. Instrum., 80, pp.065107~ (2009)
  21. John R. Taylor, "An Introduction Error Analysis: The Study of Uncertainties in Physical Measurements" (1996), University Science Books

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