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The effect of the processing parameters on the growth of GaN thick films by a sublimation technique

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The development of large area GaN substrates is one of important issues in expanding of GaN-based applications. In order to investigate the possibility, GaN thick films were grown by a sublimation technique, using MOCVD-GaN films grown on a sapphire as a seed-crystal substrate and a commercial GaN powder as a source material. The pressure in chamber under the fixed flow rate of N 2 gas and NH 3 gas was kept at 1 atmosphere and the effects of the various processing parameters such as the distance between source material and seed crystal, the temperature of top- and bottom heater and the growth time during the growth of GaN thick film were investigated. The growth feature and microstructure of the GaN thick films were observed by SEM and XRD. The optical bandgap properties and the defects were evaluated by the PL measurement. By these results, the growth conditions such as the distance between the GaN source and the seed substrate, the growth temperature and the growth time were determined for the satisfied growth of GaN thick films.

Abstract

The development of large area GaN substrates is one of important issues in expanding of GaN-based applications. In order to investigate the possibility, GaN thick films were grown by a sublimation technique, using MOCVD-GaN films grown on a sapphire as a seed-crystal substrate and a commercial GaN powder as a source material. The pressure in chamber under the fixed flow rate of N 2 gas and NH 3 gas was kept at 1 atmosphere and the effects of the various processing parameters such as the distance between source material and seed crystal, the temperature of top- and bottom heater and the growth time during the growth of GaN thick film were investigated. The growth feature and microstructure of the GaN thick films were observed by SEM and XRD. The optical bandgap properties and the defects were evaluated by the PL measurement. By these results, the growth conditions such as the distance between the GaN source and the seed substrate, the growth temperature and the growth time were determined for the satisfied growth of GaN thick films.

관련 논문AI추천

The effect of the processing parameters on the growth of GaN thick films by a sublimation techniqueCheongHyunRoh, KwangBoShim, TaeGyoungLee, YoungJuPark한국결정성장학회 · 한국결정성장학회지2003 · 제13권 제5호Effect of annealing temperature on the optical properties of a bulk GaN substrate강효상, 박재화, Hee Ae Lee, Joo Hyung Lee, Nuri Oh, Seong Kuk Lee, Seung Hoon Lee, Won Il Park청정에너지연구소 · Journal of Ceramic Processing Research2020 · 제21권 제5호Crystal characteristics of bulk GaN single crystal grown by HVPE method with the increase of thicknessCheol Woo Park, Hee Ae Lee, Hyo Sang Kang, Hyun Mi Kim, Jae Hwa Park, Joo Hyung Lee, Jung Hun Lee, Kwang Bo Shim, Seong Kuk Lee, Sin Young Bang, Suk Hyun Kang청정에너지연구소 · Journal of Ceramic Processing Research2017 · 제18권 제2호Characterization of GaN thick layer grown by the HVPE: Comparison of horizontal with vertical growth박지은, 심광보, 오동근, 은종원, 이성국, 이성철, 임지훈, 정진현, 최봉근, Van Thi Ha Lai한국결정성장학회 · 한국결정성장학회지2008 · 제18권 제3호Controlling of the heterogeniously growing GaN polycrystals using a quartz ring in the edge during the HVPE-GaN bulk growth강효상, 박재화, 박철우, 심광보, 이승국, 이주형, 이희애, 인준형청정에너지연구소 · Journal of Ceramic Processing Research2018 · 제19권 제5호Study of anisotropic crystal and electrical properties for semipolar (11-22) GaN grown on m-sapphireNa-Bil-Re Kan청정에너지연구소 · Journal of Ceramic Processing Research2012 · 제13권 제6호

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