부분최소제곱 회귀분석법을 이용한 White LED 가속수명시험법
The accelerated life testing method of White LED using the partial least squares regression
0
조회
0
다운로드
0
인용
0
참고문헌
키워드
초록
In this paper, we studied a accelerated life testing method of new concept forthe life assessment of White LED PKGs. The samples used in the study were composed oflow power LED 7type and high power LED 7type. We assorted a variety of manufacturersproducts using the characteristic of representative (structure, material, shape, size,activation energy) of the LED and made database using the data about life time, B10 ofeach LED PKGs and established calculating modification of the activation energy of LEDPKGs using 8type models of 14type models and verified a accelerated life testing methodof new concept for the life assessment of White LED PKGs using 6type models of 14typemodels. The verification test result has shown that 4type models of 6type models haveerror range in 6% in comparison with actual life of LED PKGs.
Abstract
In this paper, we studied a accelerated life testing method of new concept forthe life assessment of White LED PKGs. The samples used in the study were composed oflow power LED 7type and high power LED 7type. We assorted a variety of manufacturersproducts using the characteristic of representative (structure, material, shape, size,activation energy) of the LED and made database using the data about life time, B10 ofeach LED PKGs and established calculating modification of the activation energy of LEDPKGs using 8type models of 14type models and verified a accelerated life testing methodof new concept for the life assessment of White LED PKGs using 6type models of 14typemodels. The verification test result has shown that 4type models of 6type models haveerror range in 6% in comparison with actual life of LED PKGs.
참고문헌 (5)
- 유기훈, "LED 칩 열화특성에 적합한 열화모델 기반의수명예측 시스템 구현", 한국신뢰성학회 학술대회논문집, 6, pp.79~85 (2011)
- 장인혁, "White LED 형광체의 활성화 에너지 정형화", 신뢰성 응용연구, 13(2), pp.117~127 (2013), 한국신뢰성학회
- LED, "OLED 최신 산업동향 및 혁신기술 동향분석", 주은철, 2011
- L. Trevisanello, "Accelerated Life Test of High Brightness Light Emitting Diodes", IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 8(2) (2008)
- J. M. Kang, "Life-time estimation of high-power blue light-emitting diode chips", Microelectronics Reliability., 49, pp.1231~1235 (2009)