전자패키지 신뢰성 예측을 위한 최적 구간중도절단 시험 설계
Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages
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Qualification includes all activities to demonstrate that a product meets and exceeds the reliability goals. Manufacturers need to spend time and resources for the qualification processes under the pressure of reducing time to market, as well as offering a competitive price. Failure to qualify a product could result in economic loss such as warranty and recall claims and the manufacturer could lose the reputation in the market. In order to provide valid and reliable qualification results, manufacturers are required to make extra effort based on the operational and environmental characteristics of the product. This paper discusses optimal interval censoring design for reliability prediction of electronic packages under limited time and resources. This design should provide more accurate assessment of package capability and thus deliver better reliability prediction.
Abstract
Qualification includes all activities to demonstrate that a product meets and exceeds the reliability goals. Manufacturers need to spend time and resources for the qualification processes under the pressure of reducing time to market, as well as offering a competitive price. Failure to qualify a product could result in economic loss such as warranty and recall claims and the manufacturer could lose the reputation in the market. In order to provide valid and reliable qualification results, manufacturers are required to make extra effort based on the operational and environmental characteristics of the product. This paper discusses optimal interval censoring design for reliability prediction of electronic packages under limited time and resources. This design should provide more accurate assessment of package capability and thus deliver better reliability prediction.
참고문헌 (4)
- W. Q. Meeker, "Planning life tests in which units are inspected for failure", IEEE Transactions on Reliability, 35(5), pp.571~ (1986)
- S. R. Huang, "Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions", IEEE Transactions on Reliability, 57(3), pp.445~ (2008)
- D. H. Kwak, "Comparison of Parameter Estimation Methods for Weibull Distribution Using Interval Censored Data", Journal of the Korean Society for Quality Management, pp.102~ (2013)
- 신동희, "BGA 무연솔더(Sn-3.0Ag-0.5Cu)와 무전해 Ni-W-P 도금층 계면의 열 안정성에 대한 연구", 마이크로전자 및 패키징학회지, 17(1), pp.25~31 (2010), 한국마이크로전자및패키징학회
