토착박테리아에 의한 황동석의 등전위 변화와 표면 부착 특성
The Change of Isoelectric Points and the Attachment for Chalcopyrite by Indigenous Bacteria
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연구 목적은 토착박테리아가 42℃에서 생존하는지, 황산을 첨가하지 않아도 황동석 표면에 부착하는지 조사하였다. 황동석에 대하여 제타전위를 측정한 결과 4.20으로 나타났다. 편모로 보여지는, 구부러진 호형(弧形) 모양의 박테리아들이 황동석 표면에 부착되어 나타났다. 이들 박테리아의 길이는 대략 0.3×1.6 ㎛에서0.3×3.7 ㎛ 범위로 나타났다. 단독으로 발달된 편모로 보여지는 구조물의 길이는 약 1.1에서 약 1.6 ㎛ 범위였다. 토착박테리아를 황동석에 50일간 반응시킨 황동석에 대하여 XRD분석을 실시한 결과, 황동석결정의 (312)평면과 (116)평면에 해당되는 X-선회절선의 강도 크기가 감소하였고, 황동석의 (004)평면에 해당되는 X-선은 나타났고, 반면에 (116)평면에 해당되는 X-선은 사라졌다. 이와 같은 XRD분석 결과는 토착박테리아가 황동석의 특정결정면을 공격하기 때문으로 생각된다. 황산을 첨가하지 않은 황동석-용출실험에서, Fe 이온 함량이 비교시료에 비해 박테리아시료에서 1.6배 이상 높게 나타났고, 또한 Zn 이온 함량도 비교시료에 비해 토착박테리아 시료에서 상대적으로 높게 나타났다.
Abstract
This study was to investigate the viability of indigenous acidopuilic bacteria at 42℃, including whether there was attachment to chalcopyrite surface with no addition of sulfuric acid. On the results of the zeta potential for the chalcopyrite, the isoelectric point obtained was at a pH value of 4.20. The vibrio-shaped bacteria with flagellum were attached to halcopyrite surface, and the length of these bacteria ranged from 0.3×1.6 ㎛ to 0.3×3.7 ㎛. The length of a single flagellum with vibrio-shaped bacteria ranged from 1.1 to 1.6 ㎛. In X-ray diffraction patterns of chalcopyrite in the medium inoculated with indigenous bacteria for 50 days, the intensity of peaks corresponding to planes (312) and (116) were decreased, and a peak at plane (004) appeared, whereas the peak at plane (224) disappeared in the bacteria sample. The results of XRD analysis indicated that the indigenous bacteria were selectively attacking the chalcopyrite on a specific crystal plane. The experiment was in a chalcopyrite-leaching medium with no addition of sulfuric acid, the Fe ion content was higher in the bacteria sample up to 1.6 times more than in the control sample, and the Zn ion content was relatively more than in the control sample.
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