반도체 웨이퍼 가공 공정 역학조사에서 과거 노출평가 방법 고찰
Retrospective Exposure Assessment of Wafer Fabrication Workers in the Semiconductor Industry
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참고문헌
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초록
The objective of this study is to review retrospective exposure assessment methods used in wafer fabrication operations to determine whether adverse health effects including mortality or cancer incidence are related to employment in par-ticular work activities and to recommend an appropriate approach for retrospective exposure assessment methods for epi-demiological study. The goal of retrospective exposure assessment for such studies is to assign each study subject to a workgroup in such a way that differences in exposure within the workgroups are minimized, as well as to maximize the contrasts in exposure between workgroups. To reduce the misclassification of exposure and to determine if adverse health effects including mortality or cancer incidence are related to particular work activities of wafer fabrication workers, a min-imum requirement of work history information on the wafer manufacturing eras, job and department at which they were exposed should be assessed. Retrospective assessment of the task that semiconductor workers performed should be con-ducted to determine not only the effect of a particular job on the development of adverse health effects including mortality or cancer incidence, but also to adjust for the healthy worker effect. In order to identify specific hazardous agents that may cause adverse health effects, past exposure to a specific agent or agent matrices should also be assessed.
Abstract
The objective of this study is to review retrospective exposure assessment methods used in wafer fabrication operations to determine whether adverse health effects including mortality or cancer incidence are related to employment in par-ticular work activities and to recommend an appropriate approach for retrospective exposure assessment methods for epi-demiological study. The goal of retrospective exposure assessment for such studies is to assign each study subject to a workgroup in such a way that differences in exposure within the workgroups are minimized, as well as to maximize the contrasts in exposure between workgroups. To reduce the misclassification of exposure and to determine if adverse health effects including mortality or cancer incidence are related to particular work activities of wafer fabrication workers, a min-imum requirement of work history information on the wafer manufacturing eras, job and department at which they were exposed should be assessed. Retrospective assessment of the task that semiconductor workers performed should be con-ducted to determine not only the effect of a particular job on the development of adverse health effects including mortality or cancer incidence, but also to adjust for the healthy worker effect. In order to identify specific hazardous agents that may cause adverse health effects, past exposure to a specific agent or agent matrices should also be assessed.
참고문헌 (34)
- McElvenny, D. M., "Investigation of cancer incidence and mortality at a Scottish semiconductor manufacturing facility", Occupational Medicine, 53, pp.419~430 (2003)
- Herrick, R. F., "Exposure assessment for retrospective follow-up Studies of semiconductor-and storage device-manufacturing workers", Journal of Occupational and Environmental Medicine, 47, pp.983~995 (2005)
- LaDou, J., "Cancer and reproductive risks in the semiconductor industry", International Journal of Occupational and Environmental Health, 13, pp.376~385 (2007)
- Watterson, A., "Phase Two:Health and safety executive inspection of U.K. semiconductor manufacturers", International Journal of Occupational and Environmental Health, 9, pp.392~395 (2003)
- LaDou, J., "Occupational health in the semiconductor industry. In: Labor rights and environmental justice in the global electronics industry", pp.31~42 (2006), Temple University Press
- Baldwin, D. G., "Ion implanters : chemical and radiation safety", pp.99~105 (1988)
- Chelton, C., "Chemical hazards in the semiconductor industry", Education, IEEE Transactions on, 34, pp.269~288 (2002)
- Cox, J., "LSI semiconductor manufacturing", pp.442~488 (1984), John Wileg and Sons. Pub. Ltd
- Harrison, M., "Semiconductor manufacturing hazards", pp.472~504 (1992)
- Hawkinson, T. E., "Chemical hazards in semiconductor operations. Semiconductor safety handbook: safety and health in the semiconductor industry", pp.163~179 (1998), Noyes Publication
- Jones, J. H., "Exposure and control assessment of semiconductor manufacturing", pp.44~53 (1988)
- Stewart, J., "Electronics: semiconductor manufacturing. Industrial hygiene aspects of plant operations", pp.439~463 (1985), John Wiley and Sons Ltd. Pub
- Ungers, L. J., "Industrial hygiene and control technology assessment of ion implantation operations", American Industrial Hygiene Association Journal, 47, pp.607~614 (1986)
- Wald, P. H., "Semiconductor manufacturing: an introduction to processes and hazards", American Journal of Industrial Medicine, 11, pp.203~221 (1987)
- Sorahan, T., "Cancer incidence and cancer mortality in a cohort of semiconductor workers: an update", British Medical Journal, 49, pp.215~216 (1992)
- Sorahan, T., "Cancer incidence and cancer mortality in a cohort of semiconductor workers: An Update", British Medical Journal, 49, pp.215~216 (1992)
- Nichols, L., "Cancer incidence and cancer mortality in a cohort of UK semiconductor workers, 1970-2002", Occupational Medicine, 55, pp.625~630 (2005)
- Clapp, R. W., "Mortality among US employees of a large computer manufacturing company: 1969-2001", Environmental Health : A Global Access Science Source, 5, pp.30~30 (2006)
- Clapp, R. W., "Cancer mortality in IBM Endicott plant workers, 1969-2001: an update on a NY production plant", Environmental Health : A Global Access Science Source, 7, pp.13~ (2008)
- McElvenny, D. M., "Cancer among current and former workers at National Semiconductor (UK) Ltd., Greenock: results of an investigation by the Health and Safety Executive" (2001), HSE
- Sorahan, T., "Cancer incidence and cancer mortality in a cohort of Semiconductor Workers", British Medical Journal, 42, pp.545~550 (1985)
- Beall, C., "Mortality among semiconductor and storage device-manufacturing workers", Journal of Occupational and Environmental Medicine, 47, pp.996~1014 (2005)
- Marano, D. E., "Exposure Assessment among US workers employed in semiconductor wafer fabrication", Journal of Occupational and Environmental Medicine, 52, pp.1075~1081 (2010)
- Boice Jr, J. D., "Cancer Mortality among US workers employed in semiconductor wafer fabrication", Journal of Occupational and Environmental Medicine, 52, pp.1082~1097 (2010)
- Park, D., "A Comprehensive Review of Arsenic Levels in the Semiconductor Manufacturing Industry", ANNALS OF OCCUPATIONAL HYGIENE, 54, pp.869~879 (2010), OXFORD UNIV PRESS
- Mazurek, J., "Making microchips: policy, globalization, and economic restructuring in the semiconductor industry" (2003), The MIT Press
- Stewart, P., "Issues in performing retrospective exposure assessment", Applied Occupational & Environmental Hygiene, 6, pp.421~427 (1991)
- Stewart, P., "Challenges to retrospective exposure assessment", Scandinavian Journal of Work, Environment & Health, 25, pp.505~510 (1999)
- Smith, T., "Retrospective exposure assessment", pp.308~323 (1995), Wiley-Blackwell
- Correa, A., "Ethylene glycol ethers and risks of spontaneous abortion and subfertility", American Journal of Epidemiology, 143, pp.707~717 (1996)
- Bender, T. J., "Cancer incidence among semiconductor and electronic storage device workers", British Medical Journal, 64, pp.33~36 (2007), Cancer incidence among semiconductor and electronic storage device workers.British Medical Journal,64,33-36
- Cancer among current and former workers at National Semiconductor (UK), Ltd. Greenock. Results of an Investigation by the Health and Safety Executive, "HSE", ~ (2001)
- Li, C. Y., "A review of the healthy worker effect in occupational epidemiology", Occupational Medicine, 49, pp.225~229 (1999)
- Wald, P. H., "Semiconductor manufacturing: an introduction to processes and hazards", American Journal of Industrial Medicine, 11, pp.203~221 (1987)