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A Brief Comment on Atom Probe Tomography Applications

김영태|박찬경|설재복
한국현미경학회 (Korean Society Of Microscopy)|2016.09|Applied Microscopy|제46권 제3호|pp. 127-133

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참고문헌

키워드

Atom probe tomographyThree-dimensional characterization
주제분류자연과학일반

초록

Atom probe tomography is a time-of-flight mass spectrometry-based microanalysis technique based on the field evaporation of surface atoms of a tip-shaped specimen under an extremely high surface electric field. It enables three-dimensional characterization for deeper understanding of chemical nature in conductive materials at nanometer/atomic level, because of its high depth and spatial resolutions and ppm-level sensitivity. Indeed, the technique has been widely used to investigate the elemental partitioning in the complex microstructures, the segregation of solute atoms to the boundaries, interfaces, and dislocations as well as following of the evolution of precipitation staring from the early stage of cluster formation to the final stage of the equilibrium precipitates. The current review article aims at giving a comment to first atom probe users regarding the limitation of the techniques, providing a brief perspective on how we correctly interprets atom probe data for targeted applications.

Abstract

Atom probe tomography is a time-of-flight mass spectrometry-based microanalysis technique based on the field evaporation of surface atoms of a tip-shaped specimen under an extremely high surface electric field. It enables three-dimensional characterization for deeper understanding of chemical nature in conductive materials at nanometer/atomic level, because of its high depth and spatial resolutions and ppm-level sensitivity. Indeed, the technique has been widely used to investigate the elemental partitioning in the complex microstructures, the segregation of solute atoms to the boundaries, interfaces, and dislocations as well as following of the evolution of precipitation staring from the early stage of cluster formation to the final stage of the equilibrium precipitates. The current review article aims at giving a comment to first atom probe users regarding the limitation of the techniques, providing a brief perspective on how we correctly interprets atom probe data for targeted applications.

참고문헌 (47)

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관련 논문AI추천

A Brief Overview of Atom Probe Tomography ResearchBaptiste Gault한국현미경학회 · Applied Microscopy2016 · 제46권 제3호Atom Probe Tomography: A Characterization Method for Three-dimensional Elemental Mapping at the Atomic ScaleIvan Povstugar, Pyuck-Pa Choi한국분말재료학회 · 한국분말재료학회지2012 · 제19권 제1호Atom Probe Tomography를 이용한 나노 스케일의 조성분석: I. 이론과 설비구길호, 박찬경, 방찬우, 정우영한국현미경학회 · Applied Microscopy2011 · 제41권 제2호Focused Ion Beam-Based Specimen Preparation for Atom Probe Tomography이지영, Jae-Pyoung Ahn한국현미경학회 · Applied Microscopy2016 · 제46권 제1호Atom Probe Tomography를 이용한 나노 스케일의 조성분석: II. 전자소자 및 나노재료에서의 응용구길호, 박찬경, 방찬우, 장동현, 정우영한국현미경학회 · Applied Microscopy2011 · 제41권 제2호Direct Observation of Heterogeneous Nucleation in Al-Si-Cu-Mg Alloy Using Transmission Electron Microscopy and Three-dimensional Atom Probe Tomography황준연, David R. Diercks, Michael J. Kaufman, Rajarshi Banerjee한국현미경학회 · Applied Microscopy2013 · 제43권 제3호

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