유지보수성과 환경운용성을 개선한 야전시험장비에 대한 연구
A study on Automatic field Test Equipment with improved maintenance and environmental reliability
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In this paper, I purpose one of the development methods for portable Automatic field Test Equipment(ATE) with VME form factor. Almost portable ATE have not used to standards form factor and they are connected by mechanical non-rigid general connectors and wire harnesses among the components. Furthermore, it is hard to reuse developed board. So, it decreases to reusability of developed board and it is hard to maintenance of ATE. Even those things have weakness for vibration and drop test especially in portable ATE. The XK9A1 ATE using VME form factor has environmental reliability through vibration, drop, temperature test. It consists of 5 developed board called the control board, the wire & wireless communication board, the power supply board, the load board and the mother board. It is connected by two wire harnesses between mother board and extern circular connectors. The control board send the data and address to other board though each 16-bit data and 20-bit address line. You can develop the function board what you want to using those data & address line when it comes to needing other function board.
Abstract
In this paper, I purpose one of the development methods for portable Automatic field Test Equipment(ATE) with VME form factor. Almost portable ATE have not used to standards form factor and they are connected by mechanical non-rigid general connectors and wire harnesses among the components. Furthermore, it is hard to reuse developed board. So, it decreases to reusability of developed board and it is hard to maintenance of ATE. Even those things have weakness for vibration and drop test especially in portable ATE. The XK9A1 ATE using VME form factor has environmental reliability through vibration, drop, temperature test. It consists of 5 developed board called the control board, the wire & wireless communication board, the power supply board, the load board and the mother board. It is connected by two wire harnesses between mother board and extern circular connectors. The control board send the data and address to other board though each 16-bit data and 20-bit address line. You can develop the function board what you want to using those data & address line when it comes to needing other function board.
참고문헌 (8)
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- 윤영호, "무기체계 양산단계 자동화 시험장비(ATE) SW신뢰성 향상 방안 연구", 전자공학회논문지 - SC, 47(6), pp.19~26 (2010), 대한전자공학회
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- Ju hyung-chul, "development of VMEbus systems", Measurement Engineering information Monthly, pp.59~64 (1996)
- 김동일, "자동시험장비(ATE) 양산을 위한 시험장비의 설계 및 구현", 한국컴퓨터정보학회논문지, 22(8), pp.1~7 (2017), 한국컴퓨터정보학회[DOI]
- Design and Implementation of the multi-function switching system for Automatic Test Equipment(ATE), "Won-Ki Kim", Kumoh National Institute of Technology, ~ (2012)
- Seoung-Hwa Yang, "Study on Productivity Based maintenance Development Process Model considering the Development Security and Quality", pp.2012
- 윤명섭, "아두이노를 이용한 온도시험 장비 오동작 감시 시스템 설계 및 구현", 디지털융복합연구, 14(5), pp.317~323 (2016), 한국디지털정책학회[DOI]