자동시험장비(ATE) 양산을 위한 시험장비의 설계 및 구현

Abstract

In this paper, we proposed the test equipment that can perform separate performance tests to mass-produce the Automatic Test Equipment. Until now, the performance test of the ATE has been performed after it has been assembled perfectly. It is possible to perform the performance test only when the external device manufacturing and setting of measurement resources and the internal wiring work have been completed. So we have been studying test equipment that separately tested the switching devices that played a key role in the performance of the ATE. To build the test equipment, we reviewed the circuit card assemblies that make up the switching devices. We designed a test equipment that satisfies the performance test and apply the completed test equipment to the actual production process to analyze whether it was effective in improving the time and workability of the performance test. The test equipment has the advantage that it can be used universally in the mass production process of ATE with the same type of switching device.