신뢰성 향상을 위한 PXIe기반의 휴대용 자동시험장비의 구현

Abstract

In this paper, we propose a development method of portable Automatic Test Equipment based on PXIe platform. Legacy VME form factor structured test equipment has limited reuse and expansion of modules due to unapplied bus specification. In particular, these limitations can cause development periods and costs to increase, and the reliability of environmental conditions is lacking due to non-standard modules. The test equipment of the proposed PXIe platform can use diverse COTS modules to shorten the development period and minimize the instability between developments. The PXIe development module works with standard Xilinx FPGAs, PXIe Windows device drivers, and applications on standard PXIe buses. The use of standard bus and COTS modules increases scalability and reusability, enabling rapid development and excellent maintenance. Through the test, we show the proposed test equipments can be implemented efficiently between the development processes and proved their reliability through function tests and environmental tests.