Design Optimization of Ball Grid Array Packaging by the Taguchi Method
0
조회
0
다운로드
0
인용
0
참고문헌
키워드
초록
In this paper, a design optimization of ball grid array packaging geometry is studied based on the Taguchi method, which allowed robust design by considering the variance of the input parameters during the optimization process. Molding compound and substrate were modeled as viscoelastic, and finite element analyses were performed to calculate the strain energy densities of the eutectic solder balls. Six quality factors of the dimensions of the packaging geometry were chosen as control factors. After performing noise experiments to determine the dominant factors, main experiments were conducted to find the optimum packaging geometry. Then the strain energy densities between the original and optimized geometries were compared. It was found that the effects of the packaging geometry on the solder ball reliability were significant, and more than 40% of the strain energy density was reduced by the geometry optimization.
Abstract
In this paper, a design optimization of ball grid array packaging geometry is studied based on the Taguchi method, which allowed robust design by considering the variance of the input parameters during the optimization process. Molding compound and substrate were modeled as viscoelastic, and finite element analyses were performed to calculate the strain energy densities of the eutectic solder balls. Six quality factors of the dimensions of the packaging geometry were chosen as control factors. After performing noise experiments to determine the dominant factors, main experiments were conducted to find the optimum packaging geometry. Then the strain energy densities between the original and optimized geometries were compared. It was found that the effects of the packaging geometry on the solder ball reliability were significant, and more than 40% of the strain energy density was reduced by the geometry optimization.
참고문헌 (13)
- 손호영, "미세피치용 Cu", SnAg 더블 범프 플립칩 어셈블리의 신뢰성에 관한 연구, 2008, pp.15(2), 37~45[DOI]
- 한성원, "다양한 유무연 도금 리드프레임에 적용된 Sn-8Zn-3Bi 솔더접합부의 열충격 신뢰성 평가", 마이크로전자 및 패키징학회지, 14(2), pp.35~40 (2007), 한국마이크로전자및패키징학회
- Y. K. Kim, "Strip type panel warpag analyses for PBGA chip packaging", Microelectronics Reliability, 50, pp.398~ (2010)
- C. Mao, "Packaging parameter analysis and optimization design on solder joint reliability for twin die stacked packages by variance in strain energy density (SED) of each solder joint", Microelectronics Reliability, 48, pp.119~ (2008)
- T. Tee, "Board level solder joint reliability analysis and optimization of pyramidal stacked die BGA packages", Microelectronics Reliability, 44, pp.1957~ (2004)
- Y. Lai, "Optimal design towards enhancement of board-level thermomechanical reliability of waferlevel chip-scale packages", Microelectronics Reliability, 47, pp.104~ (2007)
- Y. Lai, "Optimization of Thermomechanical Reliability of Board-level Package-on-Package Stacking Assembly", IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 29, pp.864~ (2006)
- T. Wang, "Optimization of Thermomechanical Reliability of Board-Level Flip-Chip Packages Implemented With Organic or Silicon Substrates", IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 31(2), pp.174~ (2008)
- T. Wang, "Coupled Power and Thermal Cycling Reliability of Board-Level Package-on- Package Stacking Assembly", IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 32(1), pp.14~ (2009)
- T. Wang, "Optimization of board-level thermomechanical reliability of high performance flip-chip package assembly", Microelectronic Engineering, 85(4), pp.659~ (2008)
- G. Taguchi, "Quality engineering (Taguchi methods) for the development of electronic circuit technology", IEEE Trans Reliab., 44(2), pp.225~ (1995)
- I. Ward, "An Introduction to the Mechanical Properties of Solid Polymers" (1993), John Wiley & Sons
- G. Wang, "Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys", Journal of Electronics Packaging, 123, pp.247~ (2001)
