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Averaging Current Adjustment Technique for Reducing Pixel Resistance Variation in a Bolometer-Type Uncooled Infrared Image Sensor

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키워드

주제분류공학일반

초록

This paper presents an averaging current adjustment technique for reducing the pixel resistance variation in a bolometer-type uncooled infrared image sensor. Each unit pixel was composed of an active pixel, a reference pixel for the averaging current adjustment technique,and a calibration circuit. The reference pixel was integrated with a polysilicon resistor using a standard complementary metal-oxide-semiconductor (CMOS) process, and the active pixel was applied from outside of the chip. The averaging current adjustment techniquewas designed by using the reference pixel. The entire circuit was implemented on a chip that was composed of a reference pixel arrayfor the averaging current adjustment technique, a calibration circuit, and readout circuits. The proposed reference pixel array for the aver- aging current adjustment technique, calibration circuit, and readout circuit were designed and fabricated by a 0.35-µm standard CMOS process.

Abstract

This paper presents an averaging current adjustment technique for reducing the pixel resistance variation in a bolometer-type uncooled infrared image sensor. Each unit pixel was composed of an active pixel, a reference pixel for the averaging current adjustment technique,and a calibration circuit. The reference pixel was integrated with a polysilicon resistor using a standard complementary metal-oxide-semiconductor (CMOS) process, and the active pixel was applied from outside of the chip. The averaging current adjustment techniquewas designed by using the reference pixel. The entire circuit was implemented on a chip that was composed of a reference pixel arrayfor the averaging current adjustment technique, a calibration circuit, and readout circuits. The proposed reference pixel array for the aver- aging current adjustment technique, calibration circuit, and readout circuit were designed and fabricated by a 0.35-µm standard CMOS process.

참고문헌 (13)

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  12. P. Payandehnia, "Sequential interstage correlated double sampling: A switched-capacitor technique for high accuracy systems", Midwest Symp. Circuits Syst, pp.262~265 (2014)
  13. 김상환, "화소 전류 보상 기법을 이용한 볼로미터 형의 비냉각형 적외선 이미지 센서", 센서학회지, 25(5), pp.349~353 (2016), 한국센서학회[DOI]

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