Quasi-static Analysis on the Effect of the Finite Metal with the Anisotropic Grooved Dielectric in Microstrip Lines

참고문헌 (8)

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2. "General analysis of electrodes in integrated-optics electrooptic devices", qe-27, pp.243~251
3. "Quasi-static analysis of shielded microstrip transmission lines with thick electrodes", mtt-45, pp.288~291
4. "A mode projecting method for the quasi-static analysis of electrooptic device electrodes considering finite metallization thickness and anisotropic substrate", qe-27, pp.2306~2314
5. "Quasi-static analysis of shielded planar transmission lines with finite metallization thickness by a mixed spectral-space domain method", mtt-42, pp.249~255 (1994)
6. "The method of lines for the analysis of planar waveguides with finite metallization thickness", mtt-39, pp.107~111 (1991)
7. "Analysis of a shielded microstrip line with finite metallization thickness by the boundary element method", mtt-38, pp.1130~1132 (1990)
8. "LINPAR for Windows Matrix parameters for multiconductor transmission lines HongQuasi-static Analysis on the Effect of the Finite Metal with the Anisotropic Grooved Dielectric in Microstrip lines PAGE 5마이크로전자 및 패키징학회지 제12권 제1호 Journal of the Microelectronics & Packaging Society Vol. 12", 12(1), pp.17~20200511

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