전원장치의 HALT 신뢰성시험을 통한 설계 한계마진 검증
Verification for the design limit margin of the power device using the HALT reliability test
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The verification for the design limit margin of the power device for the information communication and surveillance systems using HALT(Highly Accelerated Life Test) reliability test is described. The HALT reliability test performs with a step stress method which change condition until the marginal step in a design and development phase. The HALT test methods are the low temperature(cold) step stress test, the high temperature(hot) step stress test, the thermal shock cyclic stess test, and the high temperature destruct limit(hot DL) step stress test. The power device is checked the operating performance during the test. In this paper, the HALT was performed to find out the design limit margin of the power device.
Abstract
The verification for the design limit margin of the power device for the information communication and surveillance systems using HALT(Highly Accelerated Life Test) reliability test is described. The HALT reliability test performs with a step stress method which change condition until the marginal step in a design and development phase. The HALT test methods are the low temperature(cold) step stress test, the high temperature(hot) step stress test, the thermal shock cyclic stess test, and the high temperature destruct limit(hot DL) step stress test. The power device is checked the operating performance during the test. In this paper, the HALT was performed to find out the design limit margin of the power device.
참고문헌 (15)
- J. W. Park, "Planning Accelerated Life Tests with Two Stress Variables: The Cases of Weibull Lifetime Distribution", Journal of the Korean Institute of Industrial Engineers, 2007(5) (2007)
- 이복신, "가속수명시험법을 이용한 냉장고용 자동제빙기의 신뢰성 향상에 관한 연구", 석사, 전기·전자·통신교육, pp.2006
- 임광현, "소프트웨어 신뢰도 품질측정 방안에 관한 연구", 한국컴퓨터정보학회논문지, 17(12), pp.187~198 (2012), 한국컴퓨터정보학회
- S. Seo, "Optional Design of Accelerated Life Tests under Model Uncertainty", Journal of the Korean Society for Quality Management, 29(3), pp.49~65 (1997)
- W. Nelson, "Accelerated Testing: Statistical Models, Test Plans, and Data Analysis" (1990), Wiley
- Quality technology for product success, "Reliability", pp.2011, Dong Su Yoo
- 이순호, "TFT-LCD 모듈의 수명 예측에 관한 연구", 석사, 전자및전기공학, pp.2008
- 신동선, "평판형 파이버 어레이를 이용한 광분배기 모듈의 초가속수명시험 및 신뢰성 평가", 박사, 무기재료공학, pp.2009
- 박희준, "초가속수명시험에 의한 분기기 제어장치의 신뢰성평가에 관한 연구", 석사, 철도시스템학과, pp.2012
- SoonMok Choi, "Accelerated Life Testing and Failure Mode Analysis for Ceramic Electronic Parts", Ceramist, 10(5), pp.108~116 (2007)
- G.K. Hobbs, "Accelerated Reliability Engineering: HALT & HASS" (2005), Hobbs Engineering
- A. Bernard, "The Ten things You Should Know about HALT & HASS", IEEE (2012)
- A.S. Nowick, "Some factors that determine proton conductivity in nonstoichiometric complex perovskites", Solid State Ionics, 125, pp.303~311 (1999)
- Challenges in Decoupling Capacitors, "L. Mosely", CDS, 3~ (2006)
- YuShin Chang, "Verification for the design margin of the power board using HALT", CICS 2017 Conference, pp.243~244 (2017)