Transmission Electron Microscope Sampling Method for Three-Dimensional Structure Analysis of Two-Dimensional Soft Materials
2
조회
0
다운로드
0
인용
0
참고문헌
키워드
초록
Sample preparation is very important for crystal structure analysis of novel nano-structured materials in electron microscopy. Generally, a grid dispersion method has been used as transmission electron microscope (TEM) sampling method of nano-powder samples. However, it is diff cult to obtain the cross-sectional information for the tabular-structured materials. In order to solve this problem, we have attempted a new sample preparation method using focused ion beam. Base on this approach, it was possible to successfully obtain the electron diffraction patterns and high-resolution TEM images of the cross-section of tabular structure. Finally, we were able to obtain three-dimensional crystallographic information of novel zeolite nano-crystal of the tabular morphology by applying the new sample preparation technique.
Abstract
Sample preparation is very important for crystal structure analysis of novel nano-structured materials in electron microscopy. Generally, a grid dispersion method has been used as transmission electron microscope (TEM) sampling method of nano-powder samples. However, it is diff cult to obtain the cross-sectional information for the tabular-structured materials. In order to solve this problem, we have attempted a new sample preparation method using focused ion beam. Base on this approach, it was possible to successfully obtain the electron diffraction patterns and high-resolution TEM images of the cross-section of tabular structure. Finally, we were able to obtain three-dimensional crystallographic information of novel zeolite nano-crystal of the tabular morphology by applying the new sample preparation technique.
참고문헌 (10)
- Chen Y, "Ultrahigh throughput silicon nanomanufacturing by simultaneous reactive ion synthesis and etching", ACS Nano, 5, pp.8002~8012 (2011)
- Corma A, "Inorganic solid acids and their use in acid-catalyzed hydrocarbon reactions", Chem. Rev, 95, pp.559~614 (1995)
- Ferrando-Villalba P, "In-plane thermal conductivity of sub-20nm thick suspended mono-crystalline Si layers", Nanotechnology, 25, pp.185402~ (2014)
- Jun Y W, "Symmetry-controlled colloidal nanocrystals: nonhydrolytic chemical synthesis and shape determining parameters", J. Phys. Chem. B, 109, pp.14795~14806 (2005)
- Kim J G, "Structure analysis of inorganic crystals by energy-fi ltered precession electron diffraction", J. Electron Microsc, 59, pp.273~283 (2010)
- Na K, "Directing zeolite structures into hierarchically nanoporous architectures", Science, 333, pp.328~332 (2011)
- Neumann W, "Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy", Bull. Pol. Ac.: Tech, 58, pp.237~253 (2010)
- Park Y M, "Measurement and estimation of temperature rise in TEM sample during ion milling", Ultramicroscopy, 107, pp.663~668 (2007)
- Sun J, "Structure determination of the zeolite IM-5 using electron crystallography", Z. Kristallogr, 225, pp.77~85 (2010)
- Tadjarodi A, "Synthesis and characterization of the special ZnO nanostructure by mechanochemical process", Mater. Lett, 92, pp.108~110 (2013)