RELIABILITY AND PROFIT ANALYSIS OF A STANDBY UNIT SYSTEM WITH CORRELATED LIFE TIME IN AN INDUSTRY
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The main objective of this work is to present a reliability analysis of a cold standby unit system with variations in production and demand, As we know that Demand of a product in the market in uences the production of that product and also the business of the company or an organization. we have assumed that only one repair person is available in the whole system. Failure and Repair times of each unit are supposed to be dependent or correlated. By utilizing regenerative point technique, number of reliability attributes are obtained which are very vital and helpful to the framework planners, mechanical supervisors and industrial managers. Graphical behaviors of mean time to system failure and pro t function have also been studied.
Abstract
The main objective of this work is to present a reliability analysis of a cold standby unit system with variations in production and demand, As we know that Demand of a product in the market in uences the production of that product and also the business of the company or an organization. we have assumed that only one repair person is available in the whole system. Failure and Repair times of each unit are supposed to be dependent or correlated. By utilizing regenerative point technique, number of reliability attributes are obtained which are very vital and helpful to the framework planners, mechanical supervisors and industrial managers. Graphical behaviors of mean time to system failure and pro t function have also been studied.
참고문헌 (3)
- G. S. Mokaddis, "A dissimilar two-unit parallel system with common-cause failure and preventive maintenance", The Journal of Mathematics and Computer Science, 19, pp.153~167 (2008)
- M. S. Kadyan, "Stochastic analysis of nonidentical units reliability models with priority and di erent modes of failure", Journal of Decision and Mathematical Sciences, 09, pp.59~82 (2004)
- R.Gupta, "Stochastic analysis of a two-unit cold standby system with maximum repair time and correlated failures and repairs", Microelectronics Reliability, 02, pp.66~76 (1996)