본문 바로가기
KERD
논문KCI 등재

샌드 블러스터로 건식 식각한 마이크로 소자 패키지용유리 웨이퍼의 표면 연구

Study of sand blaster dry etched glass wafer surfacefor micro device package

0

조회

0

다운로드

0

인용

0

참고문헌

주제분류공학일반

초록

Abstract

In this paper, glass cap wafer for MEMS device package is fabricated by using sand blaster dry etcher and Its surface is studied. The surface of dry etched glass is analyzed by using SEM, and many glass particles and micro cracks are observed. If these kind of particles were dropped from glass to the surface of device, It would make critical failure to the operation of device. So, several cleaning and etching methods are induced to remove these kinds of dormant failure mode and optimized condition is found out.

참고문헌 (4)

  1. Y. T. Cheng, "Localized silicon fusion and eutectic bonding for MEMS fabrication and packaging", 9, pp.3~8 (2000)
  2. K. Persson, "Fundamental requirements on MEMS packaging and reliability", pp.1~7 (2002)
  3. 주병권, "실리콘 기판과 ITO가 코팅된 #7059 유리 기판간의 정전 열 접합", 7(3), pp.65~71 (1998)
  4. 박길수, "RF-MEMS 소자의 웨이퍼 레벨 밀봉 패키징을 위한 열압축 본딩", 15(1), pp.58~64 (2006)

관련 논문AI추천

이 간행물의 다른 논문 (11건)