아날로그 회로의 난검출 고장을 위한 효과적인 진단 및 테스트 기법
Effective Techniques for Diagnosis and Test of Hard-to-Detect Faults in Analog Circuits
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Testing of analog(and mixed-signal) circuits has been a difficult task for test engineers and effective test techniques to solve these problems are required. This paper develops a new technique which increases fault detection and diagnosis rates for analog circuits by using extended MTSS (Modified Time Slot Specification) technique based on MTSS proposed by the author. High performance current sensors with digital outputs are used as core components for these techniques. A fault diagnosis structure with minimal hardware overhead in ATE is also described .
Abstract
Testing of analog(and mixed-signal) circuits has been a difficult task for test engineers and effective test techniques to solve these problems are required. This paper develops a new technique which increases fault detection and diagnosis rates for analog circuits by using extended MTSS (Modified Time Slot Specification) technique based on MTSS proposed by the author. High performance current sensors with digital outputs are used as core components for these techniques. A fault diagnosis structure with minimal hardware overhead in ATE is also described .
참고문헌 (8)
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- E. L. Salama, "Parameter identification approach to fault diagnosis of switched capacitor circuits", IEE Proc. Electron Trans. Cir. and Syst., pp.437~472 (1991)
- Linda S. Milor, "tutorial introduction to research on analog and mixed-signal circuit testing", IEEE Trans. Cir. and Syst., 1389(1407) (1998)
- M. Aminian, "A comprehensive examination of neural network architectures for analog fault diagnosis", Proceeding of International Joint Conference on Neural Networks, 통권 : 3, pp.2304~2309 (2001)
- Jun-Weir Lin, "Fault diagnosis for linear analog circuits", Proceedings of the Ninth Asian Test Symposium, 2000. (ATS 2000),, pp.25~30 (2000)
- J. M. Lee, "Time Slot Specification Based Approach to Analog Fault Diagnosis using Built-In Current Sensors and Test Point Insertion", Proceedings of ATS02, pp.1167~1170 (2002)
- J. M. Lee, "Specification-based Analog and Mixed-signal Circuits Test with Minimal Built-In Hardware Overhead", Proceedings of KIERE Summer Conference, pp.633~636 (2006)
- J. M. Lee, "Specification-based Analog and Mixed-signal Circuits Test with Minimal Built-In Hardware Overhead", Proceedings of KIERE Summer Conference, pp.633~636 (2006)