BGA Type 유·무연 솔더의 기계적 충격에 대한 보드레벨 신뢰성 평가
Experimental and Numerical Study on Board Level Impact Test of SnPb and SnAgCu BGA Assembly Packaging
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초록
본 연구에서는 유연솔더인 63Sn37Pb와 무연 솔더인 95.5Sn4.0Ag0.5Cu와97Sn2.5Ag0.5Cu BGA(Ball Grid Array) 패키지를 인쇄회로기판(Printed Circuit Board, PCB)에 위치에 따라 장착하고 보 드레벨의 낙하시험(Board Level Drop Test)을 실시하여 충격에 대한 유·무연 솔더의 특성을 분석하였 고 4점굽힘시험(board Level 4-point Bending Test)을 실시하여 굽힘에 대한 솔더볼의 기계적 저항특성 을 분석하였다. 또한 유한요소법(Finite Element Modeling, FEM)을 이용해 낙하시험과 4점굽힘시험에서 솔더 조인트에 미치는 응력과 변형률을 해석하였으며, 시험 설계 시에 솔더 조인트의 응력변화에 영향을 미칠 수 있는 변수를 고려하여 해석하고 결과를 비교 분석하였다. 낙하시험과 4점굽힘시험에서 모두 무 연솔더는 유연솔더보다 2배 이상 높은 신뢰성을 보였으며, PCB의 중앙에 위치한 패키지는 외각에 위치 한 패키지 보다 매우 낮은 신뢰성을 보였다. 유한요소법을 통해 해석한 결과 최외각 솔더에서 가장 큰 응 력이 발생하였고. 솔더의 조성과, 시험설계변수에 의해 응력의 발생 정도가 다름을 나타내었다.
Abstract
The reliability of leaded and lead-free solders of BGA type packages on a printed circuit board was investigated by employing the standard drop test and 4-point bending test. Tested solder joints were examined by optical microscopy to identify associated failure mode. Three-dimensional finite element analysis(FEM) with ANSYS Workbench v.11 was carried out to understand the mechanical behavior of solder joints under the influence of bending or drop impact. The results of numerical analysis are in good agreement with those obtained by experiments. Packages in the center of the PCB experienced higher stress than those in the perimeter of the PCB. The solder joints located in the outermost corner of the package sufferred from higher stress than those located in center region. In both drop and bending impact tests, the lead-free solder showed better performances than the leaded solders. The numerical analysis results indicated that stress and strain behavior of solder joint were dependent on various effective parameters.
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