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열화가 감마과정을 따르는 경우 가속열화시험의 최적 계획

Planning Accelerated Degradation Tests: the Case of Gamma Degradation Process

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주제분류학제간연구

초록

Purpose: This paper is concerned with optimally designing accelerated degradation test (ADT) plans based on a gamma process for the degradation model. Methods: By minimizing the asymptotic variance of the MLE of the q-th quantile of the lifetime distribution at the use condition, the test stress levels and the proportion of test units allocated to each stress level are optimally determined. Results: The optimal plans of ADT are developed for various combination of parameters. In addition, a method for determining the sample size is developed, and sensitivity analysis procedures are illustrated with an example. Conclusion: It is important to optimally design ADT based on a gamma process under the condition that a degradation process should be always nonnegative and strictly increasing over time.

Abstract

Purpose: This paper is concerned with optimally designing accelerated degradation test (ADT) plans based on a gamma process for the degradation model. Methods: By minimizing the asymptotic variance of the MLE of the q-th quantile of the lifetime distribution at the use condition, the test stress levels and the proportion of test units allocated to each stress level are optimally determined. Results: The optimal plans of ADT are developed for various combination of parameters. In addition, a method for determining the sample size is developed, and sensitivity analysis procedures are illustrated with an example. Conclusion: It is important to optimally design ADT based on a gamma process under the condition that a degradation process should be always nonnegative and strictly increasing over time.

참고문헌 (17)

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  3. Li, Qishan, "Optimal Design of Accelerated Degradation Tests", International Journal of Materials and Product Technology, 20(1-3), pp.73~90 (2004)
  4. Li, Qishan, "Design of an Optimal Plan for an Accelerated Degradation Test : A Case Study", International Journal of Quality and Reliability Management, 23(4), pp.426~440 (2006)
  5. Liao, Chen-Mao, "Optimal Design for Step-Stress Accelerated Degradation Tests", IEEE Transactions on Reliability, 55(1), pp.59~66 (2006)
  6. Liao, Haitao, "Reliability Prediction and Testing Plan on an Accelerated Degradation Rate Model", International Journal of Materials Product Technology, 21(5), pp.402~422 (2004)
  7. 임헌상, "열화가 Wiener process를 따르는 경우의 비용을 고려한 가속열화시험 계획", 품질경영학회지, 40(2), pp.117~125 (2012), 한국품질경영학회[DOI]
  8. Lim, Heonsang, "Optimal Design of Accelerated Degradation Tests based on Wiener Process Models", Journal of Applied Statistics, 38(2), pp.309~325 (2011)
  9. Meeker, William Q., "Statistical Methods for Reliability Data" (1998), John Wiley &Sons
  10. Nelson, W., "Accelerating Test : Statistical Models, Test Plans and Data Analysis" (1990), John Wiley &Sons
  11. Pan, Zhengqiang, "Optimal Design for Step-Stress Accelerated Degradation Test with Multiple Performance Characteristics Based on Gamma Processes", Communication in Statistics-Simulation and Computation, 43(2), pp.298~314 (2014)
  12. Park, Chanseok, "Accelerated Degradation Models for Failure based on Geometric Brownian Motion and Gamma Processes", Lifetime Data Analysis, 11(4), pp.511~527 (2005)
  13. Park, Jong-In, "Optimal Design of Accelerated Degradation Tests for Estimating Mean Lifetime at the Use Condition", Engineering Optimization, 28(3), pp.199~230 (1997)
  14. Park, Sang-Jun, "Optimal Design of Step-Stress Degradation Tests in the Case of Destructive Measurement", Quality Technology and Quantitative Management, 1(1), pp.105~124 (2004)
  15. Shi, Ying, "Accelerated Destructive Degradation Test Planning", Technometrics, 51(1), pp.1~13 (2009)
  16. Tang, Loon-Ching, "Planning of Step-Stress Accelerated Degradation Test", Proceedings of the 50th Annual Reliability and Maintainability Symposium, Los Angeles (2004), CA
  17. Tseng, Sheng-Tsaing, "Optimal Design Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes", IEEE Transactions on Reliability, 58(4), pp.611~618 (2009)

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