다수 위치 측정에서 최소 기준에 의한 공정능력지수
The Process Capability Index of Minimum Base on the Multiple Measuring Locations
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Process capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance. The previous studies have measured only one location on each part in the case of single variate. To calculate the reliable process capability, a couple of measuring locations on each part are required. In this paper, we propose a new system process capability index SC_pm(m) which is the minimum value of the location PCIs.
Abstract
Process capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance. The previous studies have measured only one location on each part in the case of single variate. To calculate the reliable process capability, a couple of measuring locations on each part are required. In this paper, we propose a new system process capability index SC_pm(m) which is the minimum value of the location PCIs.
참고문헌 (20)
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