다수 측정 위치를 갖는 단일 공정의 공정능력지수
Process capability index for single process with multiple measurement locations
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초록
Process Capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process performance. PCIs have been developed to represent process capability more exactly. In the previous studies, only one designated location on each part is measured. But even though in single process, multiple measurement locations on each part are required to calculate the reliable process capability. In this paper, we propose a new process capability index with multiple measurement locations on each part. We showed numerical examples and sensitivity analysis according to the number of measurement locations.
Abstract
Process Capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process performance. PCIs have been developed to represent process capability more exactly. In the previous studies, only one designated location on each part is measured. But even though in single process, multiple measurement locations on each part are required to calculate the reliable process capability. In this paper, we propose a new process capability index with multiple measurement locations on each part. We showed numerical examples and sensitivity analysis according to the number of measurement locations.
참고문헌 (16)
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