다측정 공정능력지수의 특성분석
Analysis of Process Capability Index for Multiple Measurements
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참고문헌
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초록
This study is concerned about the process capability index in single process. Previous process capability indices have been developed for the consistency with the nonconforming rate due to the process target value and skewness. These indices calculate the process capability by measuring one spot in an item. But the only one datum in an item reduces the representativeness of the item. In addition to the lack of representativeness, there are many cases that the uniformity of the item such as flatness of panel is absolutely important. In these cases, we have to measure several spots in an item. Also the nonconforming judgment to an item is mainly due to the range not due to the standard variation or the shift from the specifications. To imply the uniformity concept to the process capability index, we should consider only the variation in an item. It is the within subgroup variation. When the universe is composed of several subgroups, the sample standard deviation is the sum of the within subgroup variation and the between subgroup variation. So the range R which represents only the within subgroup variation is the much better measure than that of the sample standard deviation. In general, a subgroup contains a couple of individual items. But in our cases, a subgroup is an item and R is the difference between the maximum and the minimum among the measured data in an item. Even though our object is a single process index, causing by the subgroups, its analytic structure looks like a system process capability index. In this paper we propose a new process capability index considering the representativeness and uniformity.
Abstract
This study is concerned about the process capability index in single process. Previous process capability indices have been developed for the consistency with the nonconforming rate due to the process target value and skewness. These indices calculate the process capability by measuring one spot in an item. But the only one datum in an item reduces the representativeness of the item. In addition to the lack of representativeness, there are many cases that the uniformity of the item such as flatness of panel is absolutely important. In these cases, we have to measure several spots in an item. Also the nonconforming judgment to an item is mainly due to the range not due to the standard variation or the shift from the specifications. To imply the uniformity concept to the process capability index, we should consider only the variation in an item. It is the within subgroup variation. When the universe is composed of several subgroups, the sample standard deviation is the sum of the within subgroup variation and the between subgroup variation. So the range R which represents only the within subgroup variation is the much better measure than that of the sample standard deviation. In general, a subgroup contains a couple of individual items. But in our cases, a subgroup is an item and R is the difference between the maximum and the minimum among the measured data in an item. Even though our object is a single process index, causing by the subgroups, its analytic structure looks like a system process capability index. In this paper we propose a new process capability index considering the representativeness and uniformity.
참고문헌 (23)
- Baik, J. W., "Criticism and Guideline for the Use of Process Capability Index", Journal of the Korean Society for Quality Management, 27(2), pp.81~100 (1999)
- Benson, E. D., "Statistical Properties of a System of Fourth-Generation Process Capability Indices Cpsk(u, v, w)", pp.1994
- Boyles, R. A., "The Taguchi Capability Index", Journal of Quality Technology, 23(1), pp.17~26 (1991)
- Chan, L. K., "A New Measure of Process Capability", Journal of Quality Technology, 20, pp.162~175 (1988)
- 장영순, "분포분할법을 이용한 휴리스틱 공정능력지수의 비교 분석", 품질경영학회지, 41(2), pp.233~246 (2013), 한국품질경영학회[DOI]
- 조남호, "다변량 시스템 공정능력지수 (SCpsk)", 대한안전경영과학회지, 5(3), pp.145~156 (2003), 대한안전경영과학회
- Juran, J. M., "Quality Control Handbook" (1974), Mcgraw-hill
- Kane, V. E., "Process Capability Indices", Journal of Quality Technology, 18(1), pp.41~52 (1986)
- Kenney, J.F., "The Distribution in Mathematics of Statistics", pp.170~173 (1951), Van Nostrand
- Kotz, S., "Process Capability Indices-A Review 1999~2000", Journal of Quality Technology, 34(1), pp.2~19 (2002)
- Kotz, S., "Introduction to Process Capability Indices" (1998), Arnold
- Lee, D. K., "A new Mulivariate Process Capability Index", KNUT Research Journal, 20, pp.153~160 (1999)
- 이도경, "다수 측정 위치를 갖는 단일 공정의 공정능력지수", 산업경영시스템학회지, 30(3), pp.28~36 (2007), 한국산업경영시스템학회
- 이도경, "공정능력과 시그마 수준의 표시에 대한 연구：다수 위치측정에 대한 공정능력지수 기준", 산업경영시스템학회지, 32(1), pp.111~116 (2009), 한국산업경영시스템학회
- 이도경, "다수 위치 측정에서 최소 기준에 의한 공정능력지수", 산업경영시스템학회지, 34(4), pp.114~119 (2011), 한국산업경영시스템학회
- 이도경, "공정능력지수 산정에 있어 고려사항", 산업경영시스템학회지, 37(1), pp.127~132 (2014), 한국산업경영시스템학회
- Palmer, K., "A Review and Interpretations of Process Capability Indices", Annals of Operation Research, 87, pp.31~47 (1999)
- Patnaic, P. B., "The Use of Mean Range as an Estimator of Variance in Statistical Test", Biometrica, 37(1), pp.78~87 (1950)
- Pearn, W. L., "Distributional and Inferential Properties of Process Capability Indices", Journal of Quality Technology, 24(4), pp.216~231 (1992)
- Plante, R. D., "Process Capability：A Criterion for Optimizing Multiple Response Product and Process Design", IIE Transactions, 33, pp.497~509 (2001)
- Pyzedek, T., "Why normal distributions aren’t- All that normal", Quality Engineering, 7, pp.769~777 (1995)
- Quesenberry, C. P., "The Effect of Sample Size on Estimated Limits for and X bar control Charts", Journal of Quality Technology, 25, pp.237~247 (1993)
- Shiau, J. J., "Yield-Related Process Capability Indices for Processes of Multiple Quality Characteristics", Quality and Reliability Engineering International, 29(4), pp.487~507 (2013)