On-Die Noise Monitoring Circuit for System-Level ESD
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초록
Electrostatic discharge (ESD) poses a significant risk to electronic systems, potentially leading to operational malfunctions. Accurately assessing the noise waveforms induced within these systems is challenging due to various factors such as common mode (CM) noise, direct radiation coupling, and limited accessibility of external equipment. To tackle these hurdles, a novel approach involving an on-die monitoring circuit (OMC) has been proposed for integration within electronic systems. This embedded circuit enables precise measurement of noise without external interference. The OMC, can detect abnormal noise levels surpassing predefined thresholds on both signal and power networks, accurately capturing their waveforms. To validate its practicality, the OMC was implemented in a evaluation board and tested in ESD experiments. Unlike traditional oscilloscope equipment vulnerable to CM noise, the OMC successfully isolated and measured only the relevant differential mode (DM) noise generated within the system. This showcases its ability to isolate and quantify target DM noise even in complex environments, overcoming limitations of conventional equipment.
Abstract
Electrostatic discharge (ESD) poses a significant risk to electronic systems, potentially leading to operational malfunctions. Accurately assessing the noise waveforms induced within these systems is challenging due to various factors such as common mode (CM) noise, direct radiation coupling, and limited accessibility of external equipment. To tackle these hurdles, a novel approach involving an on-die monitoring circuit (OMC) has been proposed for integration within electronic systems. This embedded circuit enables precise measurement of noise without external interference. The OMC, can detect abnormal noise levels surpassing predefined thresholds on both signal and power networks, accurately capturing their waveforms. To validate its practicality, the OMC was implemented in a evaluation board and tested in ESD experiments. Unlike traditional oscilloscope equipment vulnerable to CM noise, the OMC successfully isolated and measured only the relevant differential mode (DM) noise generated within the system. This showcases its ability to isolate and quantify target DM noise even in complex environments, overcoming limitations of conventional equipment.
참고문헌 (10)
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