Design of Main Body and Edge Termination of 100 V Class Super-junction Trench MOSFET
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For the conventional power MOSFET (metal-oxide semiconductor field-effect transistor) device structure, there exists a tradeoff relationship between specific on-state resistance (Ron,sp) and breakdown voltage (BV). In order to overcome this tradeoff, a super-junction (SJ) trench MOSFET (TMOSFET) structure with uniform or non-uniform doping concentration, which decreases linearly in the vertical direction from the N drift region at the bottom to the channel at the top, for an optimal design is suggested in this paper. The on-state resistance of 0.96 mΩ-cm2 at the SJ TMOSFET is much less than that at the conventional power MOSFET under the same breakdown voltage of 100V. A design methodology for the edge termination is proposed to achieve the same breakdown voltage and on-state resistance as the main body of the super-junction TMOSFET by using of the SILVACO TCAD 2D device simulator, Atlas
Abstract
For the conventional power MOSFET (metal-oxide semiconductor field-effect transistor) device structure, there exists a tradeoff relationship between specific on-state resistance (Ron,sp) and breakdown voltage (BV). In order to overcome this tradeoff, a super-junction (SJ) trench MOSFET (TMOSFET) structure with uniform or non-uniform doping concentration, which decreases linearly in the vertical direction from the N drift region at the bottom to the channel at the top, for an optimal design is suggested in this paper. The on-state resistance of 0.96 mΩ-cm2 at the SJ TMOSFET is much less than that at the conventional power MOSFET under the same breakdown voltage of 100V. A design methodology for the edge termination is proposed to achieve the same breakdown voltage and on-state resistance as the main body of the super-junction TMOSFET by using of the SILVACO TCAD 2D device simulator, Atlas
참고문헌 (7)
- B. J. Baliga, "Advanced Power MOSFET Concepts", pp.265~354 (2010), New York Springer-Science
- "SILVACO TCAD Manual, Atlas" (2011)
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- Qinsong Qian, "A Novel Charge-Imbalance Termination for Trench Super-junction VDMOS", IEEE Electron Device Lett., 31(12), pp.1434~1436 (2010)[DOI]
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- J. K. Oh, "A New Junction Termination Method Employing Shallow Trenches Filled with Oxide", IEEE Electron Device Lett., 25(1), pp.16~18 (2004)[DOI]
