SiC 기판상에 성장된 AlN 박막을 이용한 AlN 결정 성장에 관한 연구
A study on the AlN crystal growth using its thin films grown on SiC substrate
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초록
AlN 결정은 직경 1인치 크기의 기판이 개발되었고 계속 품질의 향상을 위해 연구되고 있다. 한편 2인치급 기판은 UV LED 칩 제조와 원가 감소를 위해 개발이 필요한 실정이다. 본 연구에서는 PVT 법으로 2인치의 AlN 결정을 SiC 기판상에 성장된 AlN 박막을 종자로 사용하여 성장의 가능성을 보고자 하였다. 10 μm 두께의 AlN 박막 결정을 종자결정으로사용하여 두께 7 mm의 AlN 결정을 성장하였다. 성장된 결정은 금속현미경과 실체현미경, DCXRD를 사용하여 분석하였다.
Abstract
AlN crystal is been developing in global site for many years and 1 inch diameter wafer was already developed but it is demanding the efforts for the better quality. On the other hand, also the 2-inch size is developing recently to reduce the unit cost for manufacturing and to use to fabrication of the UV LED chips. In this study, we tried to evaluate the possibility of bulk AlN crystals on his thin films by PVT method. The AlN thin film was grown on SiC single crystal 2” wafer by HVPE method. We successfully grew AlN bulk crystal of a thickness of 7 mm using its thin film of a thickness of 10 μm as a seed crystal. The resultants of AlN crystals were identified by metallurgical microscope, optical stereographic microscope and DCXRD measurement.
참고문헌 (12)
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