전자장비의 신뢰성 및 품질 검증을 위한 ESS 최적 관리 방안 연구
A Study on ESS Optimization Management for Improving Reliability and Quality of Electronic Equipments
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In this study, we applied the concept of quantitative model beyond the qualitative approach applied to the domestic weapon system to quantitatively monitor the defect density during manufacturing process and propose the optimization management method of ESS. Based on the understanding of concept for quantitative approach, we confirms the effect of ESS optimization management method based on circuit card assembly unit. It is possible to utilize the predicted value of residual defect density step by step of ESS as a monitoring and management model
Abstract
In this study, we applied the concept of quantitative model beyond the qualitative approach applied to the domestic weapon system to quantitatively monitor the defect density during manufacturing process and propose the optimization management method of ESS. Based on the understanding of concept for quantitative approach, we confirms the effect of ESS optimization management method based on circuit card assembly unit. It is possible to utilize the predicted value of residual defect density step by step of ESS as a monitoring and management model
참고문헌 (10)
- Czerniel, Stan, "ESS", HASS effectiveness model for yield and screen profile optimization, 2015, ~
- Jongsoo Choi, "A Study on ESS Process Modeling and Application for Improving Reliability of Electronic Equipments", ~
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- Hank Caruso, "Environmental Stress Screening vs. Product Life Consumption", Journal of the IEST, 43, pp.41~44 (2000)
- IEST, "IEST-RP-PR001.1 Management and Technical Guidelines for the ESS Process", Institute of Environmental Sciences And Technology, ~ (2003)
- Jeffery D. Palmer, "Electronic-Module Environmental-Stress-Screening Data-Evaluation Technique", Proceedings Annual Reliability and Maintainability Symposium, pp.50~56 (1999)
- "Environmental Stress Screening of Electronic Equipment" (1993), Department of Defense Handbook
- "Environmental Stress Screening Process for Electronic Equipment" (1996), Department of Defense Handbook
- M. Zhao, "ESS Profiles with Step Stress Level", International Conference on Reliability, Maintainability and Safety(ICRMS), pp.1156~1161 (2011)
- TRI-SERVICE, "Technical Brief 002-93-08Environmental Stress Screening Guidelines", US TRI-SERVICE, ~ (1993)
