Microstructural Evolution and Recrystallization Behavior Traced by Electron Channeling Contrast Imaging
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초록
Electron channeling contrast imaging (ECCI) is one of the imaging techniques in scanning electron microscopy based on a variation in electron backscattering yield depending on the direction of the primary electron beam with respect to the crystal lattice. The ECCI provides not only observation of the distribution of individual grains and grain boundaries but also identification of the defects such as dislocations, twins, and stacking faults. The ECCI at the interface between recrystallized and deformed region of shot peening treated nickel clearly demonstrates the microstructural evolution during the recrystallization including original grain boundaries, and thus can provide better insight into the recrystallization behavior.
Abstract
Electron channeling contrast imaging (ECCI) is one of the imaging techniques in scanning electron microscopy based on a variation in electron backscattering yield depending on the direction of the primary electron beam with respect to the crystal lattice. The ECCI provides not only observation of the distribution of individual grains and grain boundaries but also identification of the defects such as dislocations, twins, and stacking faults. The ECCI at the interface between recrystallized and deformed region of shot peening treated nickel clearly demonstrates the microstructural evolution during the recrystallization including original grain boundaries, and thus can provide better insight into the recrystallization behavior.
참고문헌 (2)
- Lloyd G E, "Atomic number and crystallographic contrast images with the SEM: a review of backscattered electron techniques", Mineral. Mag, 51, pp.3~19 (1987)
- García de Andrés C, "Revealing austenite grain boundaries by thermal etching: advantages and disadvantages", Mater. Charact, 49, pp.121~127 (2002)