The Effects of Dielectric Coatings on Electron Emission from Tungsten
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Field electron emission measurements were performed on dielectric-coated tungsten emitters, with apex radii in the nanometer and micrometer range, which were prepared by electrochemical etching in NaOH solution. Measurements were performed in a field electron microscopy (FEM) with a base pressure <10–6 Pascal (10–8 mbar). Four different types of dielectric were used, namely: (1) Clark Electromedical Instruments epoxylite resin, (2) Epidian 6 produced by Ciech Sarzyna S. A., (3) a Radionox solution of colloidal graphite; and (4) Molyslip 2001 E compound (MoS2 and MoS). Currentvoltage measurements and FEM images were used to investigate the characteristics of these composite emitters, and to assess how the different types of dielectric coating affect the suitability of the composite emitter as a potential electron source.
Abstract
Field electron emission measurements were performed on dielectric-coated tungsten emitters, with apex radii in the nanometer and micrometer range, which were prepared by electrochemical etching in NaOH solution. Measurements were performed in a field electron microscopy (FEM) with a base pressure <10–6 Pascal (10–8 mbar). Four different types of dielectric were used, namely: (1) Clark Electromedical Instruments epoxylite resin, (2) Epidian 6 produced by Ciech Sarzyna S. A., (3) a Radionox solution of colloidal graphite; and (4) Molyslip 2001 E compound (MoS2 and MoS). Currentvoltage measurements and FEM images were used to investigate the characteristics of these composite emitters, and to assess how the different types of dielectric coating affect the suitability of the composite emitter as a potential electron source.
참고문헌 (15)
- Al-Qudah A, "Effect of insulating layer on the field electron emission performance of nano-apex metallic emitters", IOP Conf. Ser.: Mater. Sci. Eng, 92, pp.012021~ (2015)
- Crewe A V, "A simple scanning electron microscope", Rev. Sci. Instrum, 40, pp.241~246 (1969)
- Crewe A V, "A scanning microscope with 5 Å resolution", J. Mol. Biol, 48, pp.375~393 (1970)
- Crewe A V, "A high-resolution scanning transmission electron microscope", J. Appl. Phys, 39, pp.5861~5868 (1968)
- Dyke W P, "Field emission", Adv. Electronics Electron Phys, 8, pp.89~185 (1956)
- Forbes R G, "Description of field emission current", voltage characteristics in terms of scaled barrier field values, 2008, pp.26, 209~213
- Forbes R G, "Fowler-Nordheim plot analysis: a progress report", Jo. J. Phys, 8, pp.125~147 (2015)
- Latham R V, "Hot electron emission from composite metal-insulator micropoint cathodes", Appl. Phys, 19, pp.699~713 (1986)
- Madanat M A, "Electron microscopy-based performance evaluation of various tungsten fieldemitter tips Apex radii", Jo. J. Phys, 8, pp.79~85 (2015)
- Melmed A J, "The art and science and other aspects of making sharp tips", J. Vac. Sci. Technol. B, 9, pp.601~608 (1991)
- Mousa M S, "Cold cathode field emission using both Al-resin and Au-resin coatings on tungsten substrate", Surf. Sci, 231, pp.142~148 (1990)
- Mousa M S, "Study of the MgO-coated W emitters by field emission microscopy", Ultramicroscopy, 79, pp.195~202 (1999)
- Mousa M S, "Metallic and composite micropoint cathodes: aging effect and electronic and spatial characteristics", Jo. J. Phys, 1, pp.21~26 (2012)
- Mousa M S, "Switch-on phenomena in field electron and field ion microscopy", Vacuum, 45, pp.249~254 (1994)
- Zhu W, "Vacuum Microelectronics" (2001), Wiley