옥수수의 응애 저항성에 대한 조합능력과 세대평균분석
Combining Ability and Generation Mean Analysis for Resistance to Mite in Corn
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Two-spotted spider mite (Tetranychus urticae K.) can cause severe yield losses in maize (Zea mays L.). Diallel crosses(28 F1) and generation mean analysis were analyzed to determine the type of resistance to mite. In diallel crosses, Mean square forGCA efects were 8.6 times greater than that of SCA effects. This result indicated that additive gene action is more important thannon-additive gene action for mite resistance. In generation mean analysis, the estimates of three parameters showed non significantdifferences in the two crosses. Additive gene efects [a] were negative, while dominance gene efects [d] were positive in the twocrosses. It was observed that additive gene effects were greatly important than dominance gene effects for mite resistance.
Abstract
Two-spotted spider mite (Tetranychus urticae K.) can cause severe yield losses in maize (Zea mays L.). Diallel crosses(28 F1) and generation mean analysis were analyzed to determine the type of resistance to mite. In diallel crosses, Mean square forGCA efects were 8.6 times greater than that of SCA effects. This result indicated that additive gene action is more important thannon-additive gene action for mite resistance. In generation mean analysis, the estimates of three parameters showed non significantdifferences in the two crosses. Additive gene efects [a] were negative, while dominance gene efects [d] were positive in the twocrosses. It was observed that additive gene effects were greatly important than dominance gene effects for mite resistance.