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Development of AFLP Derived SCAR Marker Linked to Disease Resistance to Late Blight (Phytophthora infestans) in Potato

Hyun-Mook Cho|Young-Eun Park|Sang-Pyo Lee|Kwon-Jong Kim|Hee-Sun Jung|Hei-Young Kim|Youn-Su Lee
한국육종학회 (The Korean Society of Breeding Science)|2005.06|한국육종학회지 (KOREAN JOURNAL OF BREEDING SCIENCE)|제37권 제2호|pp. 79-85

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초록

Abstract

Late blight caused by the oomycete Phytophthora infestans is the most serious fungal disease in potato cultivationworldwide. Late blight resistance is demanding the attention of potato breeders worldwide following recent migrations of aggres-sive metalaxyl-resistant isolates of Phytophthora infestans in few major genes (R gene) which can be easily overcame by new races of Phytophthora infestans and an unknown number of genesexpressing a quantitative type of resistance which may be more durable. In this study, we used AFLP method to identify markerslinked to resistance trait. Based on AFLP method, primer combination of E+AT/M+CTC was selected out of eighty primer com-binations. The specific fragment was isolated and ligated into a T-vector, followed by transformation into E.coli. Plasmid DNAwas extracted from transformants, and the target product was harvested. The whole sequence of 136 bp were determined using T-vector and designated on LBR-1 primer set. We employed the PCR with LBR-1 of the SCAR primer. As a result, 136 bp fragmentwas observed only on HR lines but not in S lines.

참고문헌 (20)

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