Electrical properties of predominantly (100)-oriented of Ca2+ modified SrBi4Ti4O15 thin film deposited on Pt/Ti/SiO2/Si substrates
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The predominantly (100)-oriented of Ca2+ modified SrBi4Ti4O15 (Ca0.4Sr0.6Bi4Ti4O15) thin films were fabricated by optimizing the annealing treatment using the metal organic decomposition method. We studied the capacitance-voltage (C-V) curve, the dielectric constant (ε) and the dissipation fcator (tanδ), when the thin film exhibits preferred orientation, especially. The C-V curve shows a typical butterfly loop, and the ε, tanδ are about 235 and 0.033, respectively. Meanwhile, the P-E hysteresis loop as the important characteristic was characterized. The thin film displays a well-saturated P-E hysteresis loop with remanent polarization 20.3 µC/cm2 and coercive field 132 kV/cm.
Abstract
The predominantly (100)-oriented of Ca2+ modified SrBi4Ti4O15 (Ca0.4Sr0.6Bi4Ti4O15) thin films were fabricated by optimizing the annealing treatment using the metal organic decomposition method. We studied the capacitance-voltage (C-V) curve, the dielectric constant (ε) and the dissipation fcator (tanδ), when the thin film exhibits preferred orientation, especially. The C-V curve shows a typical butterfly loop, and the ε, tanδ are about 235 and 0.033, respectively. Meanwhile, the P-E hysteresis loop as the important characteristic was characterized. The thin film displays a well-saturated P-E hysteresis loop with remanent polarization 20.3 µC/cm2 and coercive field 132 kV/cm.
참고문헌 (18)
- Scott JF, "Ferroelectric memories", Science, 246, pp.1400~1405 (1989)
- Chung-Hsin Lu, "Preparation, sintering, and ferroelectric properties of layer-structured strontium bismuth titanium oxide ceramics", Journal of the European Ceramic Society, 22, pp.707~714 (2002)
- K. M. Satyalakshmi, "BaBi4Ti4O15 ferroelectric thin films grown by pulsed laser deposition", Appl. Phys. Lett., 74, pp.603~605 (1999)
- E. C. Subbarao, "Crystal Chemistry of Mixed Bismuth Oxides with Layer-Type Structure", J. Am. Ceram. Soc., 45, pp.166~169 (1962)
- H. N. Al-Shareef, "Qualitative model for the fatiguefree behavior of SrBi2Ta2O9", Appl. Phys. Lett., 68, pp.690~692 (1996)
- K. Kato, "Ferroelectric properties of alkoxy-derived CaBi4Ti4O15thin films on Pt-passivated Si", Appl. Phys. Lett., 78, pp.1119~1121 (2001)
- Charles H. Hervoches, "Structural Behavior of the Four-Layer Aurivillius-Phase Ferroelectrics SrBi4Ti4O15 and Bi5Ti3FeO15", J. Solid State Chem, 164, pp.280~291 (2002)
- Suhua Fan, "Enhanced Ferroelectric Properties of Predominantly (100)-oriented Ca0.4Sr0.6Bi4Ti4O15 Thin Films on Pt", Ti, Si Substrates, pp.J. Mater. Sci. Technol, 2010[DOI]
- G. D. Hu, "Orientation dependence of ferroelectric and piezoelectric properties of Bi3.15Nd0.85Ti3O12 thin films on Pt(100)", TiO2, Si substrates, pp.J. Appl. Phys., 2006[DOI]
- K. Kato, "Impact of oxygen ambient on ferroelectric properties of polar-axis-oriented CaBi4Ti4O15 films", Appl. Phys. Lett., 86, pp.112901~112903 (2005)
- C. J. Lu, "Anisotropic ferro- and piezoelectric properties of sol-gel-grown Bi3.15Nd0.85Ti3O12 films with two different orientations on Pt", Ti, Si, pp.Appl. Phys. Lett., 2006[DOI]
- Ho Nyung Lee, "Epitaxial growth of non-c-orientation ferroelectric SrBi2Ta2O9 thin films on SrTiO3 substrates", Journal of the European Ceramic Society., 21, pp.1565~1568 (2001)
- Hui Sun, "Large remnant polarization and excellent fatigue property of vanadiumdoped SrBi4Ti4O15 thin films", J. Appl. Phys, 100, pp.074102~ (2006)
- Dana Miu, "a-Axis growth of ferroelectric SrBi2Ta2O9 thin films on silicon", Materials Letters, 59, pp.1243~1247 (2005)
- Sonalee Chopra, "Electrical and optical properties of sol-gel derived Ca-modified PbTiO3 thin films", Materials Chemistry and Physics, 91, pp.161~165 (2005)
- A.Z. Simoes, "Ferroelectric and piezoelectric properties of bismuth layered thin films grown on (100) Pt electrodes", Journal of materials processing technology, 196, pp.10~14 (2008)
- A. Z. Simoes, "Effect of oxidizing atmosphere on the electrical properties of SrBi4Ti4O15 thin films obtained by the polymeric precursor method", Solid State Sciences, 10, pp.1951~1957 (2008)
- Kenji Takahashi, "Thickness dependence of dielectric properties in bismuth layer-structured dielectrics", Appl. Phys. Lett., 89, pp.082901~ (2006)
