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그림자 영향과 태양광 어레이 구조에 따른 최대발생전력 비교 해석 및 실험

Comparison of maximum generated power by shading effect and PV array configurations

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주제분류기타공학

초록

In this paper, two configurations of PV array are analyzed and tested under shading condition, where two configurations are series-parallel and total-cross-tied configuration. Each photovoltaic module is emulated by two 5 inch poly-crystalline cells in series and an array is constructed by connecting 24 of the modules to compare a generated maximum power of the two configurations. Pspice and Sun simulator, PASAN Ⅲb, are used for simulation and experiment to test the array under various partial shading conditions. Test results show the total-cross-tied configuration generates 7.63% higher maximum power than the series-parallel configuration, and it is well matched to the analysis and simulations of the two configurations.

Abstract

In this paper, two configurations of PV array are analyzed and tested under shading condition, where two configurations are series-parallel and total-cross-tied configuration. Each photovoltaic module is emulated by two 5 inch poly-crystalline cells in series and an array is constructed by connecting 24 of the modules to compare a generated maximum power of the two configurations. Pspice and Sun simulator, PASAN Ⅲb, are used for simulation and experiment to test the array under various partial shading conditions. Test results show the total-cross-tied configuration generates 7.63% higher maximum power than the series-parallel configuration, and it is well matched to the analysis and simulations of the two configurations.

참고문헌 (3)

  1. PV시스템의 태양전지 어레이 구성법(2), "유권종", 에기연, ~ (1997)
  2. Candela, R., "Reconfiguration techniques of partial shaded PV systems for the maximization of electrical energy production", Clean Electrical Power, 2007. ICCEP '07. International Conference on, pp.716~719 (2007)
  3. Ghali, F.M.A., "Analysis of interconnected configuration in PV arrays under fault condition", Circuits and Systems, 2003. MWSCAS '03. Proceedings of the 46th IEEE International MidwestSymposiumon, 통권 : 3, pp.1095~1099 (2003)

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