태양 전지용 CaAl2Se4: Co 단결정 박막 성장과태양 전지로의 응용
Growth of CaAl2Se4: Co Single Crystal Thin Film for Solar Cell Development and Its Solar Cell Application
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The stoichiometric mixture of evaporating materials for the CaAl2Se4: Co single crystal thin film was prepared from horizontal furnace. Using extrapolation method of X-ray diffraction patterns for the polycrystal CaAl2Se4, it was found orthorhomic structure whose lattice constant a0, b0 and c0 were 6.4818, 11.1310 Å and 11.2443 Å, respectively. To obtain the CaAl2Se4: Co single crystal thin film, CaAl2Se4: Co mixed crystal was deposited on throughly etched Si (100) by the HWE (Hot Wall Epitaxy) system. The source and substrate temperature were 600°C and 440°C respectively. The crystalline structure of CaAl2Se4: Co single crystal thin film was investigated by the double crystal X-ray diffraction (DCXD). Hall effect on this sample was measured by the method of Van der Pauw and studied on carrier density and mobility depending on temperature. From Hall data, the mobility was likely to be decreased by impurity scattering in the temperature range 30 K to 100 K and by lattice scattering in the temperature range 100 K to 293 K. The temperature dependence of the energy band gap of the CaAl2Se4: Co obtained from the absorption spectra was well described by the Varshni's relation, Eg(T) = 3.8239 eV - (4.9823 × 10-3 eV/K)T2/(T + 559 K). The open-circuit voltage, short current density, fill factor ,and conversion efficiency of p-Si/ p-CaAl2Se4: Co heterojunction solar cells under 80 mW/cm2 illumination were found to be 0.42 V, 25.3 mA/cm2, 0.75 and 9.96%, respectively.
Abstract
The stoichiometric mixture of evaporating materials for the CaAl2Se4: Co single crystal thin film was prepared from horizontal furnace. Using extrapolation method of X-ray diffraction patterns for the polycrystal CaAl2Se4, it was found orthorhomic structure whose lattice constant a0, b0 and c0 were 6.4818, 11.1310 Å and 11.2443 Å, respectively. To obtain the CaAl2Se4: Co single crystal thin film, CaAl2Se4: Co mixed crystal was deposited on throughly etched Si (100) by the HWE (Hot Wall Epitaxy) system. The source and substrate temperature were 600°C and 440°C respectively. The crystalline structure of CaAl2Se4: Co single crystal thin film was investigated by the double crystal X-ray diffraction (DCXD). Hall effect on this sample was measured by the method of Van der Pauw and studied on carrier density and mobility depending on temperature. From Hall data, the mobility was likely to be decreased by impurity scattering in the temperature range 30 K to 100 K and by lattice scattering in the temperature range 100 K to 293 K. The temperature dependence of the energy band gap of the CaAl2Se4: Co obtained from the absorption spectra was well described by the Varshni's relation, Eg(T) = 3.8239 eV - (4.9823 × 10-3 eV/K)T2/(T + 559 K). The open-circuit voltage, short current density, fill factor ,and conversion efficiency of p-Si/ p-CaAl2Se4: Co heterojunction solar cells under 80 mW/cm2 illumination were found to be 0.42 V, 25.3 mA/cm2, 0.75 and 9.96%, respectively.
참고문헌 (16)
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