퓨리에 변환 적외선 분광기를 이용한 수직 분광 복사율 측정 장치의 제작과 측정
Construction and Measurement of Normal Spectral Emissivity Device using Fourier Transform Infrared Spectrometer
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초록
퓨리에 변환 적외선 분광기(FT-IR)를 이용한 물질의 적외선 분광 복사율 측정 장치를 구축하고 이 장치의 성능을 평가하였다. 본 장치는 기준 흑체, 시료 가열로, 광학계, FT-IR로 구성되어 있으며, 측정 온도 및 파장 영역은 200℃ ~ 500℃와 3.5 μm ~ 20 μm 이다. 기준 흑체의 유효 복사율은 0.9993 이상으로 거의 1에 가까운 값을 나타내고 있었으며, 흑체의 분광 복사율에 대한 합성 상대 불확도는 0.69% 이하이다. 300℃에서 불투명한 알루미나, 흑연, 양극 처리된 알루미늄 시료의 수직 분광 복사율과, 금속(IMS200)의 표면 거칠기에 따른 복사율을 측정하였다. 금속(IMS200)의 표면 거칠기에 따른 복사율 변화는 거칠기가 증가할수록 증가하였다.
Abstract
An Instrument to measure normal spectral emissivity is built using a Fourier Transform-Infrared (FT-IR) spectrometer. The instrument is composed of four main parts, reference blackbody, sample furnace, optics system, and FT-IR spectrometer. Measurement ranges of temperature and wavelength are 200℃ ~ 500℃ and 3.5 μm ~ 20 μm, respectively. Measured emissivity of the reference blackbody is greater than 0.9993 with combined relative uncertainty less than 0.69%, which can be considered an ideal blackbody. We studied the emissivity of opaque alumina, graphite, anodized aluminum, and steel (IMS 200). It is shown that emissivity increases with the roughness of the steel (IMS 200) surface.
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