Deep SVDD 알고리즘 기반의 품질 검사 시스템 설계
Designing a quality inspection system using Deep SVDD 1)
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초록
다품종 소량 생산을 중심으로 하는 제조 기업의 경우 하나의 공정 라인에서 여러 가지의 제품들을 생산하기 때문에 자동화된 검수 보다는 작업자에 의해서 불량품을 선별하고 있다. 따라서일정한 기준 없이 작업자의 경험이나 숙련도에 의해 선별 기준이 조금씩 차이가 있어 잘못 선별이 이루어질 가능성이 높다. 또한, 크기나 모양 등이 정형화되지 않은 유연물체의 경우 선별 기준에 대한 편차가 더 커질 수 있는 문제가 있다. 이러한 문제를 해결하기 위해 본 논문에서는 인공지능 기반의 비지도 학습 방법을 적용한 품질 검사 시스템을 설계하고 실제 제조현장에서 획득한데이터 셋을 기반으로 정확도를 실험하는 연구를 진행하였다.
Abstract
In manufacturing companies that focus on small-scale production of multiple product varieties, defective products are manually selected by workers rather than relying on automated inspection. Consequently, there is a higher risk of incorrect sorting due to variations in selection criteria based on the workers' experience and expertise, without consistent standards. Moreover, for non-standardized flexible objects with varying sizes and shapes, there can be even greater deviations in the selection criteria. To address these issues, this paper designs a quality inspection system using artificial intelligence-based unsupervised learning methods and conducts research by experimenting with accuracy using a dataset obtained from real manufacturing environments.
참고문헌 (18)
- El Hajjami, S., "Machine learning for anomaly detection. performance study considering anomaly distribution in an imbalanced dataset", International Conference on Cloud Computing and Artificial Intelligence:Technologies and Applications (CloudTech), pp.1~8 (2020), IEEE
- Papernot, Nicolas, "The limitations of deep learning in adversarial settings", IEEE European symposium on security and privacy (EuroS&P), pp.372~387 (2016), IEEE
- Raj, S, "Analysis on credit card fraud detection methods", International Conference on Computer, Communication and Electrical Technology (ICCCET), pp.152~156 (2011), IEEE
- SULTANI, Waqas, "Real-world anomaly detection in surveillance videos", Proceedings of the IEEE conference on computer vision and pattern recognition, pp.6479~6488 (2018)
- Naveen Paluru, "Anam-Net: Anamorphic Depth Embedding-Based Lightweight CNN for Segmentation of Anomalies in COVID-19 Chest CT Images", IEEE Transactions on Neural Networks and Learning Systems, 32(3), pp.932~946 (2021), Institute of Electrical and Electronics Engineers (IEEE)[DOI]
- BERGMANN, Paul, "MVTec AD--A comprehensive real-world dataset for unsupervised anomaly detection", Proceedings of the IEEE, 2019, 9592~9600
- LUO, Weixin, "A revisit of sparse coding based anomaly detection in stacked rnn framework", Proceedings of the IEEE international conference on computer vision, pp.341~349 (2017)
- Mohammad Sabokrou, "Deep-Cascade: Cascading 3D Deep Neural Networks for Fast Anomaly Detection and Localization in Crowded Scenes", IEEE Transactions on Image Processing, 26(4), pp.1992~2004 (2017), Institute of Electrical and Electronics Engineers (IEEE)[DOI]
- Tolga Ergen, "Unsupervised Anomaly Detection With LSTM Neural Networks", IEEE Transactions on Neural Networks and Learning Systems, 31(8), pp.3127~3141 (2019), Institute of Electrical and Electronics Engineers (IEEE)[DOI]
- ZHOU, Chong, "Anomaly detection with robust deep autoencoders", Proceedings of the 23rd ACM SIGKDD international conference on knowledge discovery and data mining, pp.665~674 (2017)
- AKCAY, Samet, "Semi-supervised anomaly detection via adversarial training", Computer Vision–ACCV 2018: 14th Asian Conference on Computer Vision, pp.622~637 (2019), Springer International Publishing
- LIU, Wenqian, "Towards visually explaining variational autoencoders", Proceedings of the IEEE, 2020, 8642~8651
- Kang Zhou, "Memorizing Structure-Texture Correspondence for Image Anomaly Detection", IEEE Transactions on Neural Networks and Learning Systems, 33(6), pp.2335~2349 (2021), Institute of Electrical and Electronics Engineers (IEEE)[DOI]
- PERERA, Pramuditha, "Ocgan: One-class novelty detection using gans with constrained latent representations", Proceedings of the IEEE, 2019, 2898~2906
- RUFF, Lukas, "Deep one-class classification. In: International conference on machine learning", PMLR, pp.4393~4402 (2018)
- Roth, Karsten, "Towards total recall in industrial anomaly detection", Proceedings of the IEEE, 2022, 14318~14328
- Huang, Chaoqin, "Registration based few-shot anomaly detection", European Conference on Computer Vision, pp.303~319 (2022), Springer Nature Switzerland
- Zheng, Ye, "Focus your distribution: Coarse-to-fine non-contrastive learning for anomaly detection and localization", 2022 IEEE International Conference on Multimedia and Expo (ICME), pp.1~6 (2022), IEEE
