Numerical analysis of temperature fluctuation characteristics associated with thermal striping phenomena in the PGSFR
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Thermal striping is a complex thermalehydraulic phenomenon caused by fluid temperature fluctuations that can also cause high-cycle thermal fatigue to the structural wall of sodium-cooled fast reactors (SFRs). Numerical simulations using large-eddy simulation (LES) were performed to predict and evaluate the characteristics of the temperature fluctuations related to thermal striping in the upper internal structure (UIS) of the prototype generation-IV sodium-cooled fast reactor (PGSFR). Specific monitoring points were established for the fluid region near the control rod driving mechanism (CRDM) guide tubes, CRDM guide tube walls, and UIS support plates, and the normalized mean and fluctuating temperatures were investigated at these points. It was found that the location of the maximum amplitude of the temperature fluctuations in the UIS was the lowest end of the inner wall of the CRDM guide tube, and the maximum value of the normalized fluctuating temperatures was 17.2%. The frequency of the maximum temperature fluctuation on the CRDM guide tube walls, which is an important factor in thermal striping, was also analyzed using the fast Fourier transform analysis. These results can be used for the structural integrity evaluation of the UIS in SFR
Abstract
Thermal striping is a complex thermalehydraulic phenomenon caused by fluid temperature fluctuations that can also cause high-cycle thermal fatigue to the structural wall of sodium-cooled fast reactors (SFRs). Numerical simulations using large-eddy simulation (LES) were performed to predict and evaluate the characteristics of the temperature fluctuations related to thermal striping in the upper internal structure (UIS) of the prototype generation-IV sodium-cooled fast reactor (PGSFR). Specific monitoring points were established for the fluid region near the control rod driving mechanism (CRDM) guide tubes, CRDM guide tube walls, and UIS support plates, and the normalized mean and fluctuating temperatures were investigated at these points. It was found that the location of the maximum amplitude of the temperature fluctuations in the UIS was the lowest end of the inner wall of the CRDM guide tube, and the maximum value of the normalized fluctuating temperatures was 17.2%. The frequency of the maximum temperature fluctuation on the CRDM guide tube walls, which is an important factor in thermal striping, was also analyzed using the fast Fourier transform analysis. These results can be used for the structural integrity evaluation of the UIS in SFR
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