A way Analyzing Oxide Layer on an Irradiated CANDU-PHWR Pressure Tube Using an EPMA and X-ray Image Mapping
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초록
The oxide layer in samples taken from an irradiated Zr-2.5Nb pressure tube from a CANDU-PHWR reactorwas analyzed using electron probe microanalysis (EPMA). The examined tube had been exposed totemperatures ranging from 264 to 306 oC and a neutron fluence of 8.9 × 1021 n/cm2 (E > 1 MeV) for themaximum 10 effective full-power years in a nuclear power plant. Measuring oxide layer thickness generallyemploys optical microscopy. However, in this study, analysis of the oxide layer from the irradiatedpressure tube components was undertaken through X-ray image mapping obtained using EPMA. The oxidelayer characteristics were analyzed by X-ray image mapping with 256 × 256 pixels using EPMA. In addition,the slope of the oxide layer was measured for each location. A particular advantage of this study wasthat backscattered electrons and X-ray image mapping were obtained at a magnification of 9,000 when20 kV volts and 30 uA of current were applied to radiation-shielded EPMA. The results of this studyshould usefully contribute to the study of the oxide layer properties of various types of metallic materialsirradiated by high radiation in nuclear power plants.
Abstract
The oxide layer in samples taken from an irradiated Zr-2.5Nb pressure tube from a CANDU-PHWR reactorwas analyzed using electron probe microanalysis (EPMA). The examined tube had been exposed totemperatures ranging from 264 to 306 oC and a neutron fluence of 8.9 × 1021 n/cm2 (E > 1 MeV) for themaximum 10 effective full-power years in a nuclear power plant. Measuring oxide layer thickness generallyemploys optical microscopy. However, in this study, analysis of the oxide layer from the irradiatedpressure tube components was undertaken through X-ray image mapping obtained using EPMA. The oxidelayer characteristics were analyzed by X-ray image mapping with 256 × 256 pixels using EPMA. In addition,the slope of the oxide layer was measured for each location. A particular advantage of this study wasthat backscattered electrons and X-ray image mapping were obtained at a magnification of 9,000 when20 kV volts and 30 uA of current were applied to radiation-shielded EPMA. The results of this studyshould usefully contribute to the study of the oxide layer properties of various types of metallic materialsirradiated by high radiation in nuclear power plants.
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