IP 셋톱박스 테스트의 효율성을 향상시키기 위한 새로운 탐색적 테스팅 방법
A New Exploratory Testing Method for Improving the Effective IP Set-Top Box Test
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초록
Recently, as various IP set-top boxes based on Android OS have been widely used in general households and public facilities, complaints about services and set-top boxes have continued to increase as much as other smart devices. In order to reduce this problem, the manufacturer performs the testing work before the product is commercialized. However, the testing can reduce potential defects in the product, but it can not prove that the product is free of defects. Therefore, the quality of the product can vary depending on how effective testing techniques are introduced. In this paper, we propose a new exploratory testing method that minimizes test case creation time and makes it easier to plan and execute test while simultaneously learning how to run the product under test. Using the first proposed method, the test time is reduced by about 16.7 hours and the defect detection rate is 25.4% higher than the formal specification-based testing method. Informally, the test time was shortened by about 4.7 hours and the defect detection rate was 13% higher than the informal experience-based testing method.
Abstract
Recently, as various IP set-top boxes based on Android OS have been widely used in general households and public facilities, complaints about services and set-top boxes have continued to increase as much as other smart devices. In order to reduce this problem, the manufacturer performs the testing work before the product is commercialized. However, the testing can reduce potential defects in the product, but it can not prove that the product is free of defects. Therefore, the quality of the product can vary depending on how effective testing techniques are introduced. In this paper, we propose a new exploratory testing method that minimizes test case creation time and makes it easier to plan and execute test while simultaneously learning how to run the product under test. Using the first proposed method, the test time is reduced by about 16.7 hours and the defect detection rate is 25.4% higher than the formal specification-based testing method. Informally, the test time was shortened by about 4.7 hours and the defect detection rate was 13% higher than the informal experience-based testing method.
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