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표면결함 평가를 위한 유도전류 비파괴검사기법

Non-destructive Inspection Techniques based on the Induction Current for Surface Defects Evaluation

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주제분류기계공학

초록

Detection and sizing of defects are very important for structure life management base on fracture mechanics. The non-destructive inspection techniques based on the induced current field measurement are newly developed. This paper describes the results obtained by these techniques for artificial surface defects. In the case of the RICFM technique, the potential drop distribution around a surface defects was measured as a smaller potential drop than that in a place without a defect. This potential drop showed a minimum value at the defect location, and the absolute value of this minimum value increases depending on the depth of the defect. In the case of the FEF technique, the potential difference distribution for surface defects was measured as a maximum at the location of the defect. This maximum value showed a difference depending on the depth of the defect.

Abstract

Detection and sizing of defects are very important for structure life management base on fracture mechanics. The non-destructive inspection techniques based on the induced current field measurement are newly developed. This paper describes the results obtained by these techniques for artificial surface defects. In the case of the RICFM technique, the potential drop distribution around a surface defects was measured as a smaller potential drop than that in a place without a defect. This potential drop showed a minimum value at the defect location, and the absolute value of this minimum value increases depending on the depth of the defect. In the case of the FEF technique, the potential difference distribution for surface defects was measured as a maximum at the location of the defect. This maximum value showed a difference depending on the depth of the defect.

참고문헌 (8)

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  3. Aboutorabi, A. A., "Measurement of flaw profile of semi-elliptical surface flaws using the AC potential technique", NDT Inter, 16, pp.139~ (1983)
  4. Kim, H., "A study on induced current focusing potential drop(ICFPD)technique-Examination of the sizing accuracy of defects and its frequency dependence-", Journal of the Society of Materials Science Japan, 43(494), pp.1482~1488 (1994)
  5. Kim, H., "A study on induced current focusing potential drop(ICFPD)technique-Improvement of probe and application for the estimation of 2-dimensional surface defect", Journal of the Society of Materials Science Japan, 44(500), pp.669~674 (1995)
  6. Kim, H, "Evaluation of Blind Defects in Paramagnetic Materials by Aluminum Probe of ICFPD Method", Journal of the Korea Society of Mechanical Technology, 22(3), pp.436~442 (2020)
  7. Kim, H., "Evaluation of Surface Defects in Ferromagnetic Materials by Aluminum Probe of ICFPD Method", Journal of the Korea Society of Mechanical Technology, 21(2), pp.280~287 (2019)
  8. Sato, Y., "High Sensitivity Inspection of Defects in Welds by Remotely Induced Current Potential Drop Technique", Nondestructive Characterization of Materials IX, pp.107~112 (1999), American Institute of Physics

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