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전자 빔 조사 민감 물질의 전자회절분석을 위한 Imaging Plate 기술

Imaging Plate Technique for the Electron Diffraction Study of a Radiation-sensitive Material under Electron Beam

이정용|김양수|김윤중|김진규|김영민
한국현미경학회 (Korean Society Of Microscopy)|2008.09|Applied Microscopy|제38권 제3호|pp. 185-193

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참고문헌

주제분류자연과학일반

초록

Abstract

An experimental comparison of the detection properties between imaging plate and film for recording the electron diffraction pattern was carried out on a radiation-sensitive material, an aluminum trihydroxide (gibbsite, γ-Al(OH)₃), through the electron beam irradiation. Because the imaging plate has a wide dynamic range sufficient for recording extremely low- and high-electron intensities, the range of spatial frequency for the diffraction pattern acquired by the imaging plate was extended to two times larger than the range by the film, especially at a low electron dose condition (‹0.1 e-/μm2). It is also demonstrated that the imaging plate showed better resolving power for discriminating fine intensity levels even in saturated transmitted beam. Hence, in the respect of investigating the structures of radiation-sensitive materials and cryobiological specimens, our experimental demonstrations suggest that the imaging plate technique may be a good choice for those studies, which have to use an extremely low electron intensity for recording.

참고문헌 (33)

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