Development of electron ptychography from algorithms, detectors to its applications

Abstract

Electron ptychography has emerged as a powerful computational imaging technique using four-dimensional scanning transmission electron microscopy, greatly exceeding the resolution limits of conventional electron microscopes by quantitative phase retrieval. This paper presents recent algorithmic developments and technological requirements for detectors used in electron ptychography, as well as applications in different fields of nanoscience. The application range covers high-resolution imaging of beam-sensitive specimens, light element detection, and three-dimensional reconstruction, making electron ptychography a versatile technique for materials characterization.