DISTRIBUTION OF RUN-LENGTH FOR MULTIVARIATE CONTROL CHARTS WITH RULES USING EMBEDDED FINITE MARKOV CHAIN
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A multivariate control chart that observes various charac- teristics at the same time was proposed by Hotelling. However, Hotelling's control chart has the disadvantage of slowing the speed of detecting anomalies when very small changes in the process occur, so rules for mul- tivariate control charts have been proposed. In this paper, to increase the sensitivity of the Shewhart chart, which has the same shortcomings, the proposed rule, Western Electronic Company's rule, is applied to the multivariate chart to obtain the run-length distribution. The run-length distribution is calculated by recognizing that an abnormality occurs in the process when the mean vector of the process changes in the pro- duction process. The run-length distribution of the multivariate control chart obtained using the proposed runs rule and the embedded nite Markov chain conrmed that the mean of run-lengths decreased sharply when very small changes occurred in the process. This means the speed of detecting small changes in the process is fast. Therefore, this method is expected to be eective when observing very small changes due to multivariate quality control problems.
Abstract
A multivariate control chart that observes various charac- teristics at the same time was proposed by Hotelling. However, Hotelling's control chart has the disadvantage of slowing the speed of detecting anomalies when very small changes in the process occur, so rules for mul- tivariate control charts have been proposed. In this paper, to increase the sensitivity of the Shewhart chart, which has the same shortcomings, the proposed rule, Western Electronic Company's rule, is applied to the multivariate chart to obtain the run-length distribution. The run-length distribution is calculated by recognizing that an abnormality occurs in the process when the mean vector of the process changes in the pro- duction process. The run-length distribution of the multivariate control chart obtained using the proposed runs rule and the embedded nite Markov chain conrmed that the mean of run-lengths decreased sharply when very small changes occurred in the process. This means the speed of detecting small changes in the process is fast. Therefore, this method is expected to be eective when observing very small changes due to multivariate quality control problems.
참고문헌 (17)
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