검사 오류를 고려한 다단계 선별절차에 관한 연구

Abstract

Multistage screening is a common practice when a component has a critical effect on the function of the assembly. A defect in a component might incur malfunction of an electronic device, resulting in a great amount of loss. Multistage screening, including duplicated screening inspections, may provide a good solution for this problem when inspection errors are present. In the company studied here, the manufacturing process of the multiple layer chip capacitor includes two-stage screening. In the first stage, screening inspection is performed repeatedly until no defects are found in the lot. In the second stage, sampling inspection is performed by a group of experts prior to shipment. In this article, we review the procedure used in the field and suggest a revised model of the multiple screening procedure and solution method for this situation. The usefulness of the proposed model is discussed through a practical example.