수술중신경계감시검사에서 발생하는 인공산물의 종류와 해결 방법
Artifacts and Troubleshooting in Intraoperative Neurophysiological Monitoring
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초록
수술중신경계감시에서 혼입되는 artifact의 종류는 매우 다양하고 검사에 방해 되는 artifact의 제거 또한 필수적이다. 그리고 artifact를 제거해서 검사의 질을 향상시키는 것이 검사자의 역량이며 환자의 안전을 위한 최선의 방법이다. 하지만 경험이 부족해서 수술실의 장비나 마취에 관한 사항들에 대한 숙지가 미흡한 경우 상황에 맞는 적절한 방법으로 artifact를 제거할수 없다. 만약 artifact가 구별 및 제거되지 않고 진행된 검사의판독은 수술 진행에 혼선을 초래하며 이는 신속하고 정교함이요구되는 신경외과 수술에 치명적인 문제가 될 수 있다. 본 논문에서는 수술 중에 발생하는 artifact의 원인을 전기적요인과 비전기적인 요인 그리고 기타 요인들로 분류하였고 상황에 맞게artifact를 제거하는 방법과 검사법에 대해 언급하였다. 수술실의 환경이 동시에 여러가지 상황을 고려해야 하는 매우 민감한조건이지만, 다양한 artifact의 형태와 원인을 숙지하여 안정적이고 원활한 수술중신경계감시가 되길 바란다.
Abstract
The types of artifacts that are observed in intraoperative neurophysiological monitoring (INM) is truly diverse. The removal of artifacts that interfere with the examination is essential. In addition, improving the quality of the examination by removing artifacts is a reflection of the competency of the examiner and is also the best way to ensure patient safety. However, if knowledge of the equipment or anesthesia in the operating room is insufficient due to lack of experience, artifacts cannot be removed even with a method appropriate to the situation. If artifacts are not separated and removed, the reading of the examination results in confusion in the operation process. This can be a fatal problem in neurosurgery that requires rapid and sophisticated procedures. In this paper, the causes of artifacts that occur during surgery are classified into electrical factors, non-electrical factors, and other factors, and a method and examination method for removing artifacts according to the specific situation is mentioned. Although the operating room environment is a very critical place to simultaneously consider various scenarios, we hope that a stable and optimal INM will play a role by knowing the types and causes of various artifacts and how to tackle them.
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