Structure and Conductivity Characteristics of Sandwich Structures with Fullerite Films
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Abstract
We report on the technology of formation of sandwich structures based on fullerite films and on experimental results in research of optical and conductivity properties of these sandwich samples. Single crystals of sapphire (100) or silicon were used as substrates. The sandwich specimens were based on the structure M/C60/M (M = Cr, Pd, Ag, Al, Cu). The thickness of the fullerite films was about 0.2 ~1.0 mm. The area of the C60 film under the top contact was about 1 cm2. The specimens have been investigated by infrared spectroscopy, spectra-photometry, ellipsometry and X-ray diffraction analysis. Measurements of the current/voltage characteristics and research on the temperature dependence of conductivity were performed as well. It was shown that metals such as Cr, Pd, Ag, Al, and Cu penetrate easily into the fullerite films. It appears that these specimens have a large conductivity. For silver/C60 and other sandwich structures the conductivities show a semiconductor-like behaviour.
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