FIB milling을 이용한 고정밀 다이아몬드공구 제작과 공정에 관한 연구
A study on the fabrication and processing of ultra-precision diamond tools using FIB milling
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초록
Recently, research for machining next-generation micro semiconductor processes and micro patterns has been actively conducted. In particular, it is applied to various industrial fields depending on the machining method in the case of FIB (Focused ion beam) milling. In this study, intends to deal with FIB milling machining technology for ultra-precision diamond tool fabrication technology. Ultra-precision diamond tools require nano-scale precision, and FIB milling is a useful method for nano-scale precision machining. However, FIB milling has a problem of Gaussian characteristics that are differently formed according to the beam current due to the input of an ion beam source, and there are process conditions to be considered, such as a side clearance angle problem of a diamond tool that is differently formed according to the tilting angle. A series of process steps for fabrication a ultra-precision diamond tool were studied and analyzed for each process. It was confirmed that the effect on the fabrication process was large depending on the spot size of the beam and the current of the beam as a result of the experimental analysis.
Abstract
Recently, research for machining next-generation micro semiconductor processes and micro patterns has been actively conducted. In particular, it is applied to various industrial fields depending on the machining method in the case of FIB (Focused ion beam) milling. In this study, intends to deal with FIB milling machining technology for ultra-precision diamond tool fabrication technology. Ultra-precision diamond tools require nano-scale precision, and FIB milling is a useful method for nano-scale precision machining. However, FIB milling has a problem of Gaussian characteristics that are differently formed according to the beam current due to the input of an ion beam source, and there are process conditions to be considered, such as a side clearance angle problem of a diamond tool that is differently formed according to the tilting angle. A series of process steps for fabrication a ultra-precision diamond tool were studied and analyzed for each process. It was confirmed that the effect on the fabrication process was large depending on the spot size of the beam and the current of the beam as a result of the experimental analysis.
참고문헌 (8)
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- Baek, S. Y., "A Study on Fabrication of Ultra-Precision Diamond Tool and Length Optimization for Improving the Stability", Key Engineering Materials, 777, pp.289~293 (2018), Trans Tech Publications Ltd
- 조항은, "전자 빔과 이온 빔 가공기술의 현황", 한국정밀공학회지, 35(3), pp.241~252 (2018), 한국정밀공학회
- Orloff, J., "High resolution focused ion beams : FIB and its applications", Physics Today, 57(1), pp.54~55 (2004)
